Measurement time reduction technique for input referred noise of dynamic comparator

Yuki Ishijima, Shuya Nakagawa, Hiroki Ishikuro

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.

    Original languageEnglish
    Title of host publicationICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages202-205
    Number of pages4
    Volume2018-March
    ISBN (Electronic)9781538650691
    DOIs
    Publication statusPublished - 2018 Jun 12
    Event2018 IEEE International Conference on Microelectronic Test Structures, ICMTS 2018 - Austin, United States
    Duration: 2018 Mar 192018 Mar 22

    Other

    Other2018 IEEE International Conference on Microelectronic Test Structures, ICMTS 2018
    CountryUnited States
    CityAustin
    Period18/3/1918/3/22

    Keywords

    • binary search
    • DAC
    • dynamic comparator
    • input referred noise

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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  • Cite this

    Ishijima, Y., Nakagawa, S., & Ishikuro, H. (2018). Measurement time reduction technique for input referred noise of dynamic comparator. In ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures (Vol. 2018-March, pp. 202-205). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS.2018.8383799