Measurement time reduction technique for input referred noise of dynamic comparator

Yuki Ishijima, Shuya Nakagawa, Hiroki Ishikuro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.

Original languageEnglish
Title of host publicationICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages202-205
Number of pages4
Volume2018-March
ISBN (Electronic)9781538650691
DOIs
Publication statusPublished - 2018 Jun 12
Event2018 IEEE International Conference on Microelectronic Test Structures, ICMTS 2018 - Austin, United States
Duration: 2018 Mar 192018 Mar 22

Other

Other2018 IEEE International Conference on Microelectronic Test Structures, ICMTS 2018
CountryUnited States
CityAustin
Period18/3/1918/3/22

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Time measurement

Keywords

  • binary search
  • DAC
  • dynamic comparator
  • input referred noise

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Ishijima, Y., Nakagawa, S., & Ishikuro, H. (2018). Measurement time reduction technique for input referred noise of dynamic comparator. In ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures (Vol. 2018-March, pp. 202-205). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS.2018.8383799

Measurement time reduction technique for input referred noise of dynamic comparator. / Ishijima, Yuki; Nakagawa, Shuya; Ishikuro, Hiroki.

ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures. Vol. 2018-March Institute of Electrical and Electronics Engineers Inc., 2018. p. 202-205.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ishijima, Y, Nakagawa, S & Ishikuro, H 2018, Measurement time reduction technique for input referred noise of dynamic comparator. in ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures. vol. 2018-March, Institute of Electrical and Electronics Engineers Inc., pp. 202-205, 2018 IEEE International Conference on Microelectronic Test Structures, ICMTS 2018, Austin, United States, 18/3/19. https://doi.org/10.1109/ICMTS.2018.8383799
Ishijima Y, Nakagawa S, Ishikuro H. Measurement time reduction technique for input referred noise of dynamic comparator. In ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures. Vol. 2018-March. Institute of Electrical and Electronics Engineers Inc. 2018. p. 202-205 https://doi.org/10.1109/ICMTS.2018.8383799
Ishijima, Yuki ; Nakagawa, Shuya ; Ishikuro, Hiroki. / Measurement time reduction technique for input referred noise of dynamic comparator. ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures. Vol. 2018-March Institute of Electrical and Electronics Engineers Inc., 2018. pp. 202-205
@inproceedings{d192bd3db71842758ab9df22681415ae,
title = "Measurement time reduction technique for input referred noise of dynamic comparator",
abstract = "Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.",
keywords = "binary search, DAC, dynamic comparator, input referred noise",
author = "Yuki Ishijima and Shuya Nakagawa and Hiroki Ishikuro",
year = "2018",
month = "6",
day = "12",
doi = "10.1109/ICMTS.2018.8383799",
language = "English",
volume = "2018-March",
pages = "202--205",
booktitle = "ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Measurement time reduction technique for input referred noise of dynamic comparator

AU - Ishijima, Yuki

AU - Nakagawa, Shuya

AU - Ishikuro, Hiroki

PY - 2018/6/12

Y1 - 2018/6/12

N2 - Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.

AB - Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.

KW - binary search

KW - DAC

KW - dynamic comparator

KW - input referred noise

UR - http://www.scopus.com/inward/record.url?scp=85049245357&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85049245357&partnerID=8YFLogxK

U2 - 10.1109/ICMTS.2018.8383799

DO - 10.1109/ICMTS.2018.8383799

M3 - Conference contribution

AN - SCOPUS:85049245357

VL - 2018-March

SP - 202

EP - 205

BT - ICMTS 2018 - Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures

PB - Institute of Electrical and Electronics Engineers Inc.

ER -