Metal artifact reduction in X-ray CT image using discriminant analysis method and sin curve interpolation

Keisuke Inagaki, Toshiyuki Tanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

When there is the material that is high absorbency such as metal in the object, X-ray CT image often has artifacts that are abnormal findings. This artifact is called metal artifact. Metal artifact can be obstacle when examining objects accurately. Therefore, it is expected that artifact is reduced by a user of X-ray CT. To reduce metal artifact, various methods have been studied but any methods are not compatible with shape of the object and removing metal artifact. In this study, we applied the method with discriminant analysis method and sin curve interpolation. As a result, we could almost remove metal artifact and keep shape of object. However, cross artifact was left in the nonmetal part in the method.

Original languageEnglish
Title of host publication2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages894-897
Number of pages4
Volume2017-November
ISBN (Electronic)9784907764579
DOIs
Publication statusPublished - 2017 Nov 10
Event56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 - Kanazawa, Japan
Duration: 2017 Sep 192017 Sep 22

Other

Other56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
CountryJapan
CityKanazawa
Period17/9/1917/9/22

Keywords

  • Discriminant analysis method
  • Metal artifact
  • Sin curve interpolation
  • X-ray CT

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Optimization
  • Control and Systems Engineering
  • Instrumentation

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  • Cite this

    Inagaki, K., & Tanaka, T. (2017). Metal artifact reduction in X-ray CT image using discriminant analysis method and sin curve interpolation. In 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 (Vol. 2017-November, pp. 894-897). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/SICE.2017.8105517