Through pump-probe experiment using femtosecond laser pulses, we demonstrated that the defect density distribution in a GaAs and InGaP can be imaged by the decay time of photo-excited carriers.
|Number of pages||2|
|Journal||OSA Trends in Optics and Photonics Series|
|Publication status||Published - 2004 Jan 1|
|Event||Conference on Lasers and Electro-Optics, CLEO - Washington, DC, United States|
Duration: 2004 May 17 → 2004 May 19
ASJC Scopus subject areas