Microscopic imaging of defect density distribution in GaAs and InGaP using the decay time of photo-excited carriers

K. Horiuchi, S. Kamata, M. Sato, Fumihiko Kannari, M. Hase, M. Kitajima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Through pump-probe experiment using femtosecond laser pulses, we demonstrated that the defect density distribution in a GaAs and InGaP can be imaged by the decay time of photo-excited carriers.

Original languageEnglish
Title of host publicationOSA Trends in Optics and Photonics Series
PublisherOptical Society of American (OSA)
Pages813-814
Number of pages2
Volume96 A
Publication statusPublished - 2004
EventConference on Lasers and Electro-Optics, CLEO - Washington, DC, United States
Duration: 2004 May 172004 May 19

Other

OtherConference on Lasers and Electro-Optics, CLEO
CountryUnited States
CityWashington, DC
Period04/5/1704/5/19

Fingerprint

Defect density
Ultrashort pulses
Pumps
Imaging techniques
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Horiuchi, K., Kamata, S., Sato, M., Kannari, F., Hase, M., & Kitajima, M. (2004). Microscopic imaging of defect density distribution in GaAs and InGaP using the decay time of photo-excited carriers. In OSA Trends in Optics and Photonics Series (Vol. 96 A, pp. 813-814). Optical Society of American (OSA).

Microscopic imaging of defect density distribution in GaAs and InGaP using the decay time of photo-excited carriers. / Horiuchi, K.; Kamata, S.; Sato, M.; Kannari, Fumihiko; Hase, M.; Kitajima, M.

OSA Trends in Optics and Photonics Series. Vol. 96 A Optical Society of American (OSA), 2004. p. 813-814.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Horiuchi, K, Kamata, S, Sato, M, Kannari, F, Hase, M & Kitajima, M 2004, Microscopic imaging of defect density distribution in GaAs and InGaP using the decay time of photo-excited carriers. in OSA Trends in Optics and Photonics Series. vol. 96 A, Optical Society of American (OSA), pp. 813-814, Conference on Lasers and Electro-Optics, CLEO, Washington, DC, United States, 04/5/17.
Horiuchi K, Kamata S, Sato M, Kannari F, Hase M, Kitajima M. Microscopic imaging of defect density distribution in GaAs and InGaP using the decay time of photo-excited carriers. In OSA Trends in Optics and Photonics Series. Vol. 96 A. Optical Society of American (OSA). 2004. p. 813-814
Horiuchi, K. ; Kamata, S. ; Sato, M. ; Kannari, Fumihiko ; Hase, M. ; Kitajima, M. / Microscopic imaging of defect density distribution in GaAs and InGaP using the decay time of photo-excited carriers. OSA Trends in Optics and Photonics Series. Vol. 96 A Optical Society of American (OSA), 2004. pp. 813-814
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AU - Hase, M.

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