Nanometer-scale mapping of local work function with a photon-assisted STM technique

Yasuo Nakayama, Hiroshi Kondoh, Toshiaki Ohta

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Local work-function mapping has been performed using scanning tunneling microscopy (STM) combined with visible laser light. Spatial distribution of the work function was visualized for inhomogeneous alkali-metal overlayers on a patterned Cu surface in a nanometer scale formed by nitrogen ion implantation. The spatial resolution of this technique is estimated to be in a sub-nanometer range.

Original languageEnglish
Pages (from-to)18-22
Number of pages5
JournalApplied Surface Science
Volume241
Issue number1-2 SPEC. ISS.
DOIs
Publication statusPublished - 2005 Feb 28
Externally publishedYes

Fingerprint

Scanning tunneling microscopy
scanning tunneling microscopy
Photons
Alkali Metals
nitrogen ions
photons
Alkali metals
Ion implantation
alkali metals
Spatial distribution
ion implantation
spatial distribution
Nitrogen
spatial resolution
Lasers
lasers

Keywords

  • Alkali metals
  • Cu(1 0 0)
  • N implantation
  • Photo-assisted STM
  • Scanning tunneling microscopy
  • Work function

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

Nanometer-scale mapping of local work function with a photon-assisted STM technique. / Nakayama, Yasuo; Kondoh, Hiroshi; Ohta, Toshiaki.

In: Applied Surface Science, Vol. 241, No. 1-2 SPEC. ISS., 28.02.2005, p. 18-22.

Research output: Contribution to journalArticle

Nakayama, Yasuo ; Kondoh, Hiroshi ; Ohta, Toshiaki. / Nanometer-scale mapping of local work function with a photon-assisted STM technique. In: Applied Surface Science. 2005 ; Vol. 241, No. 1-2 SPEC. ISS. pp. 18-22.
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