Nanoscale control of layer thickness for EL devices by mass-controlled layer-by-layer sequential adsorption process

Seimei Shiratori, Masayoshi Yamada, Takahiro Ito, Tom C. Wang, Michael F. Rubner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A mass controlled layer-by-layer sequential adsorption process for polyelectrolytes was newly developed for the fabrication of functional devices using ultra-thin organic film formed by various polymers of different polarity of charge. In this study hydrophobic Ruthenium complex monomer (tris(bipyridyl) ruthenium(II) hexafluorophosphate) was micelle-wrapped with an anionic surfactant, sodium dodecylbenzenesulfonate, and was assembled with PAH (poly (allylamine hydrochloride)), which has the opposite charge, on ITO substrates. With this method, we succeeded in fabricating ultra-thin organic films even when the adsorption material is not polymer but monomer. Moreover it was found that the film thickness of the self-assembled Ru micelle/PAH had a linear relationship with the number of bilayers. By using this process, an EL device was fabricated by depositing the thin film of micelle-wrapping ruthenium complex monomer on ITO and metal electrode on top of the film. Light emission was observed by applying voltage to this device.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Volume598
Publication statusPublished - 2000
EventElectrical, Optical, and Magnetic Properties of Organic Solid-State Materials V - Boston, MA, USA
Duration: 2000 Nov 292000 Dec 3

Other

OtherElectrical, Optical, and Magnetic Properties of Organic Solid-State Materials V
CityBoston, MA, USA
Period00/11/2900/12/3

Fingerprint

Ruthenium
Micelles
Monomers
Polycyclic aromatic hydrocarbons
Adsorption
Polymers
2,2'-Dipyridyl
Anionic surfactants
Light emission
Polyelectrolytes
Film thickness
Metals
Sodium
Fabrication
Thin films
Electrodes
Electric potential
Substrates

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Shiratori, S., Yamada, M., Ito, T., Wang, T. C., & Rubner, M. F. (2000). Nanoscale control of layer thickness for EL devices by mass-controlled layer-by-layer sequential adsorption process. In Materials Research Society Symposium - Proceedings (Vol. 598). Materials Research Society.

Nanoscale control of layer thickness for EL devices by mass-controlled layer-by-layer sequential adsorption process. / Shiratori, Seimei; Yamada, Masayoshi; Ito, Takahiro; Wang, Tom C.; Rubner, Michael F.

Materials Research Society Symposium - Proceedings. Vol. 598 Materials Research Society, 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shiratori, S, Yamada, M, Ito, T, Wang, TC & Rubner, MF 2000, Nanoscale control of layer thickness for EL devices by mass-controlled layer-by-layer sequential adsorption process. in Materials Research Society Symposium - Proceedings. vol. 598, Materials Research Society, Electrical, Optical, and Magnetic Properties of Organic Solid-State Materials V, Boston, MA, USA, 00/11/29.
Shiratori S, Yamada M, Ito T, Wang TC, Rubner MF. Nanoscale control of layer thickness for EL devices by mass-controlled layer-by-layer sequential adsorption process. In Materials Research Society Symposium - Proceedings. Vol. 598. Materials Research Society. 2000
Shiratori, Seimei ; Yamada, Masayoshi ; Ito, Takahiro ; Wang, Tom C. ; Rubner, Michael F. / Nanoscale control of layer thickness for EL devices by mass-controlled layer-by-layer sequential adsorption process. Materials Research Society Symposium - Proceedings. Vol. 598 Materials Research Society, 2000.
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