Abstract
We have grown the compound semiconductor ZnO1-xSex by radical source MBE. SIMS depth profile of Se concentration shows the compositional ordering of the ZnO1-xSex layers. The period of ZnO1-xSex natural compositional ordering decreases with increasing Se concentration. The lateral coherence of the compositional alternations of ZnO1-xSex cannot be explained without taking into account the dynamical surface processes into consideration.
Original language | English |
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Pages (from-to) | 633-637 |
Number of pages | 5 |
Journal | Journal of Crystal Growth |
Volume | 251 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 2003 Apr |
Externally published | Yes |
Event | Proceedings of the Molecular Beam Epitaxy 2002 - San Francisco, CA, United States Duration: 2002 Sept 15 → 2002 Sept 20 |
Keywords
- A1. Bandgap engineering
- A1. Self-ordering
- A3. Molecular beam epitaxy
- B1. Zinc oxide
- B2. Semiconducting II-VI materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry