TY - GEN
T1 - Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe
AU - Saiki, T.
N1 - Publisher Copyright:
© 2001 Optical Soc. Of America.
Copyright:
Copyright 2016 Elsevier B.V., All rights reserved.
PY - 2001
Y1 - 2001
N2 - Summary form only given. Polarization-sensitive imaging using near-field scanning optical microscopy (NSOM) is a fundamental method for the magneto-optical study of micro-structures. The polarization NSOM also offers another contrast mechanism based on the depolarization effect due to the near-field tip-sample interaction. For achievement of higher resolution and application to opaque materials, internal-reflection NSOM (IR-NSOM) with an aperture probe is the most promising technique. Here, we demonstrate the operation of IR-NSOM through the investigation of phase-change recording media. By obtaining background suppression as high as 10-5, amorphous marks are clearly imaged with an optical contrast higher than that in conventional far-field configuration.
AB - Summary form only given. Polarization-sensitive imaging using near-field scanning optical microscopy (NSOM) is a fundamental method for the magneto-optical study of micro-structures. The polarization NSOM also offers another contrast mechanism based on the depolarization effect due to the near-field tip-sample interaction. For achievement of higher resolution and application to opaque materials, internal-reflection NSOM (IR-NSOM) with an aperture probe is the most promising technique. Here, we demonstrate the operation of IR-NSOM through the investigation of phase-change recording media. By obtaining background suppression as high as 10-5, amorphous marks are clearly imaged with an optical contrast higher than that in conventional far-field configuration.
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U2 - 10.1109/QELS.2001.961882
DO - 10.1109/QELS.2001.961882
M3 - Conference contribution
AN - SCOPUS:84958279526
T3 - Technical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001
SP - 80
BT - Technical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Quantum Electronics and Laser Science Conference, QELS 2001
Y2 - 6 May 2001 through 11 May 2001
ER -