Near-field optical spectroscopy and its application to quantitative characterization of optical materials

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)680-684
Number of pages5
JournalSeimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Volume66
Issue number5
Publication statusPublished - 2000
Externally publishedYes

Fingerprint

Near field scanning optical microscopy
Optical materials
Semiconductor quantum dots
Spectroscopy
Semiconductor materials
Optical spectroscopy

Keywords

  • Carrier-to-noise ratio
  • DVD-RAM
  • Near-field scanning optical microscopy
  • Optical fiber probe
  • Quantum dot
  • Semiconductor
  • Spatial resolution
  • Spectroscopy

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

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