Near-field optical spectroscopy of excitons in single quantum dots

Toshiharu Saiki, Kenichi Nishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

InGaAs single quantum dot photoluminescence spectra and images are investigated by using a low-temperature near-field optical microscope. By modifying the commonly used near-field apertured probe, a high spatial resolution and high detection efficiency are achieved simultaneously. Local collection of the emission signal through a 500 nm (λ/2) aperture contributes to the single-dot imaging with a λ/6 resolution, which is a significant improvement over the conventional spatially resolved spectroscopy. Tailoring the tapered structure of the near-field probe enables us to obtain the emission spectra of single dots in the weak excitation region, where the carrier injection rate is ∼107 excitons/s per dot. By employing such a technique, we examine the evolution of single-dot emission spectra with excitation intensity. In addition to the ground-state emission, excited-state and biexciton emissions are observed for higher excitation intensities. By a precise investigation of the excitation power dependences of individual dots, two-dimensional identification of their emission origins is obtained for the first time.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsS Jutamulia, T Asakura
Pages212-221
Number of pages10
Volume3467
DOIs
Publication statusPublished - 1998
Externally publishedYes
EventFar- and Near-Field Optics: Physics and Information Processing - San Diego, CA, United States
Duration: 1998 Jul 231998 Jul 24

Other

OtherFar- and Near-Field Optics: Physics and Information Processing
CountryUnited States
CitySan Diego, CA
Period98/7/2398/7/24

Fingerprint

Excitons
Semiconductor quantum dots
near fields
quantum dots
excitons
Excited states
Ground state
spectroscopy
excitation
Photoluminescence
Microscopes
Spectroscopy
Imaging techniques
emission spectra
probes
carrier injection
optical microscopes
Temperature
spatial resolution
apertures

Keywords

  • Biexciton
  • Exciton
  • Near-field optical microscope
  • Photoluminescence
  • Quantum dot

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Saiki, T., & Nishi, K. (1998). Near-field optical spectroscopy of excitons in single quantum dots. In S. Jutamulia, & T. Asakura (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3467, pp. 212-221) https://doi.org/10.1117/12.326821

Near-field optical spectroscopy of excitons in single quantum dots. / Saiki, Toshiharu; Nishi, Kenichi.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / S Jutamulia; T Asakura. Vol. 3467 1998. p. 212-221.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Saiki, T & Nishi, K 1998, Near-field optical spectroscopy of excitons in single quantum dots. in S Jutamulia & T Asakura (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3467, pp. 212-221, Far- and Near-Field Optics: Physics and Information Processing, San Diego, CA, United States, 98/7/23. https://doi.org/10.1117/12.326821
Saiki T, Nishi K. Near-field optical spectroscopy of excitons in single quantum dots. In Jutamulia S, Asakura T, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3467. 1998. p. 212-221 https://doi.org/10.1117/12.326821
Saiki, Toshiharu ; Nishi, Kenichi. / Near-field optical spectroscopy of excitons in single quantum dots. Proceedings of SPIE - The International Society for Optical Engineering. editor / S Jutamulia ; T Asakura. Vol. 3467 1998. pp. 212-221
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