Near-infrared nano-imaging spectroscopy of semiconductor quantum dots using a phase change mask layer

Nobuhiro Tsumori, Motoki Takahashi, Toshiharu Saiki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We proposed a near-infrared nano-imaging spectroscopy of semiconductor quantum structures using a phase change mask layer. The performance of this method was demonstrated by numerical simulation and photoluminescence measurement of quantum dots.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2011
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529107
DOIs
Publication statusPublished - 2011 Jan 1
EventCLEO: Science and Innovations, CLEO_SI 2011 - Baltimore, MD, United States
Duration: 2011 May 12011 May 6

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherCLEO: Science and Innovations, CLEO_SI 2011
CountryUnited States
CityBaltimore, MD
Period11/5/111/5/6

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Tsumori, N., Takahashi, M., & Saiki, T. (2011). Near-infrared nano-imaging spectroscopy of semiconductor quantum dots using a phase change mask layer. In CLEO: Science and Innovations, CLEO_SI 2011 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/cleo_at.2011.jtui60