Negative ion photoelectron spectroscopy of 2,2'-bithiophene cluster anions, (2T)n- (n = 1-100)

M. Mitsui, Y. Matsumoto, N. Ando, Atsushi Nakajima

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Cluster anions of 2,2'-bithiophene, (2T)n -, were produced up to n ∼ 500 in the gas-phase. The energetics of the excess electron in the (2T)n - clusters with n =1-100 were explored by negative ion photoelectron spectroscopy. When the vertical detachment energies (VDEs) obtained from the photoelectron spectra were analyzed by a plot against n-1/3, it has been revealed that the excess electron trapping level thus extrapolated is located at ∼0.8 eV below the conduction band minimum (i.e. LUMO) of the 2T thin film. The large slope of the VDEs vs. n-1/3 plot suggests that the neutral 2T molecules surrounding the anion core take non-planar twisted conformations with permanent dipole moments, resulting in the exceedingly deep trapping of the excess electron in the 2T cluster anions.

Original languageEnglish
Pages (from-to)169-172
Number of pages4
JournalEuropean Physical Journal D
Volume34
Issue number1-3
DOIs
Publication statusPublished - 2005 Jul

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negative ions
photoelectron spectroscopy
anions
detachment
plots
trapping
electrons
conduction bands
dipole moments
photoelectrons
vapor phases
slopes
energy
thin films
molecules

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Atomic and Molecular Physics, and Optics

Cite this

Negative ion photoelectron spectroscopy of 2,2'-bithiophene cluster anions, (2T)n- (n = 1-100). / Mitsui, M.; Matsumoto, Y.; Ando, N.; Nakajima, Atsushi.

In: European Physical Journal D, Vol. 34, No. 1-3, 07.2005, p. 169-172.

Research output: Contribution to journalArticle

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