Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry

Satoshi Hashizume, Yasuaki Monnai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a method for measuring water content in a sample using CW terahertz reflectometry. A Vector Network Analyzer (VNA) is used to irradiate a 300 GHz band terahertz wave to a wet sample, and the complex reflection coefficient is measured. The temporal change of the water content is thus observed by analyzing the change of the complex reflection coefficient. By fitting the measurement result with a multi-reflection model, we experimentally confirmed the observation of the moisture change on a paper sample.

Original languageEnglish
Title of host publication2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
PublisherIEEE Computer Society
Pages649-650
Number of pages2
ISBN (Electronic)9781728166209
DOIs
Publication statusPublished - 2020 Nov 8
Externally publishedYes
Event45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States
Duration: 2020 Nov 82020 Nov 13

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume2020-November
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Country/TerritoryUnited States
CityVirtual, Buffalo
Period20/11/820/11/13

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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