Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry

Satoshi Hashizume; Yasuaki Monnai

doi:10.1109/IRMMW-THz46771.2020.9370990

Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry

Satoshi Hashizume, Yasuaki Monnai

Department of Applied Physics and Physico-Informatics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a method for measuring water content in a sample using CW terahertz reflectometry. A Vector Network Analyzer (VNA) is used to irradiate a 300 GHz band terahertz wave to a wet sample, and the complex reflection coefficient is measured. The temporal change of the water content is thus observed by analyzing the change of the complex reflection coefficient. By fitting the measurement result with a multi-reflection model, we experimentally confirmed the observation of the moisture change on a paper sample.

Original language	English
Title of host publication	2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Publisher	IEEE Computer Society
Pages	649-650
Number of pages	2
ISBN (Electronic)	9781728166209
DOIs	https://doi.org/10.1109/IRMMW-THz46771.2020.9370990
Publication status	Published - 2020 Nov 8
Event	45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States Duration: 2020 Nov 8 → 2020 Nov 13

Publication series

Name	International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume	2020-November
ISSN (Print)	2162-2027
ISSN (Electronic)	2162-2035

Conference

Conference	45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Country/Territory	United States
City	Virtual, Buffalo
Period	20/11/8 → 20/11/13

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/IRMMW-THz46771.2020.9370990

Cite this

Hashizume, S., & Monnai, Y. (2020). Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry. In 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 (pp. 649-650). [9370990] (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; Vol. 2020-November). IEEE Computer Society. https://doi.org/10.1109/IRMMW-THz46771.2020.9370990

Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry. / Hashizume, Satoshi; Monnai, Yasuaki.

2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020. IEEE Computer Society, 2020. p. 649-650 9370990 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; Vol. 2020-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hashizume, S & Monnai, Y 2020, Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry. in 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020., 9370990, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, vol. 2020-November, IEEE Computer Society, pp. 649-650, 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020, Virtual, Buffalo, United States, 20/11/8. https://doi.org/10.1109/IRMMW-THz46771.2020.9370990

Hashizume S, Monnai Y. Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry. In 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020. IEEE Computer Society. 2020. p. 649-650. 9370990. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). doi: 10.1109/IRMMW-THz46771.2020.9370990

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abstract = "We present a method for measuring water content in a sample using CW terahertz reflectometry. A Vector Network Analyzer (VNA) is used to irradiate a 300 GHz band terahertz wave to a wet sample, and the complex reflection coefficient is measured. The temporal change of the water content is thus observed by analyzing the change of the complex reflection coefficient. By fitting the measurement result with a multi-reflection model, we experimentally confirmed the observation of the moisture change on a paper sample.",

author = "Satoshi Hashizume and Yasuaki Monnai",

note = "Funding Information: ACKNOWLEDGMENT This work was supported by Japan Science and Technology Agency, PRESTO Grand Number JPMJPR18J9,Japan. Publisher Copyright: {\textcopyright} 2020 IEEE.; 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 ; Conference date: 08-11-2020 Through 13-11-2020",

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N2 - We present a method for measuring water content in a sample using CW terahertz reflectometry. A Vector Network Analyzer (VNA) is used to irradiate a 300 GHz band terahertz wave to a wet sample, and the complex reflection coefficient is measured. The temporal change of the water content is thus observed by analyzing the change of the complex reflection coefficient. By fitting the measurement result with a multi-reflection model, we experimentally confirmed the observation of the moisture change on a paper sample.

AB - We present a method for measuring water content in a sample using CW terahertz reflectometry. A Vector Network Analyzer (VNA) is used to irradiate a 300 GHz band terahertz wave to a wet sample, and the complex reflection coefficient is measured. The temporal change of the water content is thus observed by analyzing the change of the complex reflection coefficient. By fitting the measurement result with a multi-reflection model, we experimentally confirmed the observation of the moisture change on a paper sample.

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Non-contact inspection of Moisture Change Based on CW Terahertz Reflectometry

Abstract

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