Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner

Takashi Kobayashi; Toshiyuki Tanaka

doi:10.1109/SICE.2015.7285467

Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner

Takashi Kobayashi, Toshiyuki Tanaka

Department of Applied Physics and Physico-Informatics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In X-ray CT, medical X-ray exposure is the key issue for patients. Recently, low dose exposure is demanded in the industrial X-ray CT. But the dose of X-ray and the image quality are directly correlated. Therefore, research objective is to get high quality images trying to minimize X-ray exposure. Specifically, we reduce the number of X-ray views. We supplied data by using linear interpolation. As a result, we were able to eliminate conspicuous line noise to occur by having reduced the number of views. But different noises extending to horizontal rotatory direction occurred in the method.

Original language	English
Title of host publication	2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	41-44
Number of pages	4
ISBN (Electronic)	9784907764487
DOIs	https://doi.org/10.1109/SICE.2015.7285467
Publication status	Published - 2015 Sept 30
Event	54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015 - Hangzhou, China Duration: 2015 Jul 28 → 2015 Jul 30

Publication series

Name	2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015

Other

Other	54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
Country/Territory	China
City	Hangzhou
Period	15/7/28 → 15/7/30

Keywords

Linear interpolation
Low dose exposure
The number of views
X-ray CT

ASJC Scopus subject areas

Control and Systems Engineering

Access to Document

10.1109/SICE.2015.7285467

Cite this

Kobayashi, T., & Tanaka, T. (2015). Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner. In 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015 (pp. 41-44). [7285467] (2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SICE.2015.7285467

Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner. / Kobayashi, Takashi; Tanaka, Toshiyuki.
2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 41-44 7285467 (2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kobayashi, T & Tanaka, T 2015, Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner. in 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015., 7285467, 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015, Institute of Electrical and Electronics Engineers Inc., pp. 41-44, 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015, Hangzhou, China, 15/7/28. https://doi.org/10.1109/SICE.2015.7285467

Kobayashi T, Tanaka T. Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner. In 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 41-44. 7285467. (2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015). doi: 10.1109/SICE.2015.7285467

Kobayashi, Takashi ; Tanaka, Toshiyuki. / Notice of Removal : Image quality improvement for low dose exposure in the sparse X-ray CT scanner. 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 41-44 (2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015).

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abstract = "In X-ray CT, medical X-ray exposure is the key issue for patients. Recently, low dose exposure is demanded in the industrial X-ray CT. But the dose of X-ray and the image quality are directly correlated. Therefore, research objective is to get high quality images trying to minimize X-ray exposure. Specifically, we reduce the number of X-ray views. We supplied data by using linear interpolation. As a result, we were able to eliminate conspicuous line noise to occur by having reduced the number of views. But different noises extending to horizontal rotatory direction occurred in the method.",

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Notice of Removal: Image quality improvement for low dose exposure in the sparse X-ray CT scanner

Abstract

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Keywords

ASJC Scopus subject areas

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