NOVEL APPROACH TO FAULT-TOLERANT LOGIC.

Yoshiyasu Takefuji, Masahiro Ikeda

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

This paper presents a design scheme that supplies logic circuits with very high reliability by providing redundancy to gate function logic using conventional gates. The basic redundant logic circuits are called Fault-Tolerant Gates (FTGs). The construction and design of FTGs, such as AND, OR, NOT, NAND, NOR and Exclusive OR gates, are described. The improved reliability of these FTGs is evaluated in comparison with conventional gates.

Original languageEnglish
Pages (from-to)119-126
Number of pages8
JournalJournal of Information Processing
Volume3
Issue number3
Publication statusPublished - 1980
Externally publishedYes

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Logic circuits
Redundancy

ASJC Scopus subject areas

  • Engineering(all)

Cite this

NOVEL APPROACH TO FAULT-TOLERANT LOGIC. / Takefuji, Yoshiyasu; Ikeda, Masahiro.

In: Journal of Information Processing, Vol. 3, No. 3, 1980, p. 119-126.

Research output: Contribution to journalArticle

Takefuji, Yoshiyasu ; Ikeda, Masahiro. / NOVEL APPROACH TO FAULT-TOLERANT LOGIC. In: Journal of Information Processing. 1980 ; Vol. 3, No. 3. pp. 119-126.
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