TY - JOUR

T1 - Numerical analysis of atomic density distribution in arc driven negative ion sources

AU - Yamamoto, T.

AU - Shibata, T.

AU - Kashiwagi, M.

AU - Hatayama, A.

AU - Sawada, K.

AU - Hanada, M.

PY - 2014/2

Y1 - 2014/2

N2 - The purpose of this study is to calculate atomic (H0) density distribution in JAEA 10 ampere negative ion source. A collisional radiative model is developed for the calculation of the H0 density distribution. The non-equilibrium feature of the electron energy distribution function (EEDF), which mainly determines the H0 production rate, is included by substituting the EEDF calculated from 3D electron transport analysis. In this paper, the H0 production rate, the ionization rate, and the density distribution in the source chamber are calculated. In the region where high energy electrons exist, the H0 production and the ionization are enhanced. The calculated H0 density distribution without the effect of the H0 transport is relatively small in the upper region. In the next step, the effect should be taken into account to obtain more realistic H0 distribution.

AB - The purpose of this study is to calculate atomic (H0) density distribution in JAEA 10 ampere negative ion source. A collisional radiative model is developed for the calculation of the H0 density distribution. The non-equilibrium feature of the electron energy distribution function (EEDF), which mainly determines the H0 production rate, is included by substituting the EEDF calculated from 3D electron transport analysis. In this paper, the H0 production rate, the ionization rate, and the density distribution in the source chamber are calculated. In the region where high energy electrons exist, the H0 production and the ionization are enhanced. The calculated H0 density distribution without the effect of the H0 transport is relatively small in the upper region. In the next step, the effect should be taken into account to obtain more realistic H0 distribution.

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U2 - 10.1063/1.4852296

DO - 10.1063/1.4852296

M3 - Review article

AN - SCOPUS:84893026563

VL - 85

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 2

M1 - 02B125

ER -