Numerical analysis of H- ion transport processes in Cs-seeded negative ion sources

D. Matsushita, N. Takado, Akiyoshi Hatayama, T. Inoue

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The H- ion transport processes are numerically simulated to understand the extraction process of surface-produced H- ions. The three-dimensional transport code using Monte Carlo method has been applied to calculate the H- ion extraction probabilities in the model geometry of the JAEA 10 ampere negative ion source. The roles of (1) filter magnetic field and (2) collisions with neutrals (H0 atoms and H2 molecules) on the H- ion extraction are systematically studied. The results show that H- ions are extracted mainly by the filter magnetic field under the low gas pressure condition. The simulation results of extracted H- ion beam intensity in the JAEA 10 ampere negative ion source without the magnetic filter tend to be smaller than the experimental results, especially under the low pressure condition. Further model improvements, e.g., modeling and implementation of the effects of the electric field near the extraction aperture, will be required to understand the extraction process of the H- ions under the low gas pressure condition.

Original languageEnglish
Article number02A527
JournalReview of Scientific Instruments
Volume79
Issue number2
DOIs
Publication statusPublished - 2008

Fingerprint

Ion sources
negative ions
ion sources
numerical analysis
Numerical analysis
Negative ions
ion extraction
low pressure
Ions
filters
gas pressure
ions
neutral atoms
Magnetic filters
magnetic fields
Magnetic fields
Monte Carlo method
apertures
ion beams
Gases

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Numerical analysis of H- ion transport processes in Cs-seeded negative ion sources. / Matsushita, D.; Takado, N.; Hatayama, Akiyoshi; Inoue, T.

In: Review of Scientific Instruments, Vol. 79, No. 2, 02A527, 2008.

Research output: Contribution to journalArticle

Matsushita, D. ; Takado, N. ; Hatayama, Akiyoshi ; Inoue, T. / Numerical analysis of H- ion transport processes in Cs-seeded negative ion sources. In: Review of Scientific Instruments. 2008 ; Vol. 79, No. 2.
@article{5b3db1ceb94b43fe8c0d27624dd97034,
title = "Numerical analysis of H- ion transport processes in Cs-seeded negative ion sources",
abstract = "The H- ion transport processes are numerically simulated to understand the extraction process of surface-produced H- ions. The three-dimensional transport code using Monte Carlo method has been applied to calculate the H- ion extraction probabilities in the model geometry of the JAEA 10 ampere negative ion source. The roles of (1) filter magnetic field and (2) collisions with neutrals (H0 atoms and H2 molecules) on the H- ion extraction are systematically studied. The results show that H- ions are extracted mainly by the filter magnetic field under the low gas pressure condition. The simulation results of extracted H- ion beam intensity in the JAEA 10 ampere negative ion source without the magnetic filter tend to be smaller than the experimental results, especially under the low pressure condition. Further model improvements, e.g., modeling and implementation of the effects of the electric field near the extraction aperture, will be required to understand the extraction process of the H- ions under the low gas pressure condition.",
author = "D. Matsushita and N. Takado and Akiyoshi Hatayama and T. Inoue",
year = "2008",
doi = "10.1063/1.2804898",
language = "English",
volume = "79",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "2",

}

TY - JOUR

T1 - Numerical analysis of H- ion transport processes in Cs-seeded negative ion sources

AU - Matsushita, D.

AU - Takado, N.

AU - Hatayama, Akiyoshi

AU - Inoue, T.

PY - 2008

Y1 - 2008

N2 - The H- ion transport processes are numerically simulated to understand the extraction process of surface-produced H- ions. The three-dimensional transport code using Monte Carlo method has been applied to calculate the H- ion extraction probabilities in the model geometry of the JAEA 10 ampere negative ion source. The roles of (1) filter magnetic field and (2) collisions with neutrals (H0 atoms and H2 molecules) on the H- ion extraction are systematically studied. The results show that H- ions are extracted mainly by the filter magnetic field under the low gas pressure condition. The simulation results of extracted H- ion beam intensity in the JAEA 10 ampere negative ion source without the magnetic filter tend to be smaller than the experimental results, especially under the low pressure condition. Further model improvements, e.g., modeling and implementation of the effects of the electric field near the extraction aperture, will be required to understand the extraction process of the H- ions under the low gas pressure condition.

AB - The H- ion transport processes are numerically simulated to understand the extraction process of surface-produced H- ions. The three-dimensional transport code using Monte Carlo method has been applied to calculate the H- ion extraction probabilities in the model geometry of the JAEA 10 ampere negative ion source. The roles of (1) filter magnetic field and (2) collisions with neutrals (H0 atoms and H2 molecules) on the H- ion extraction are systematically studied. The results show that H- ions are extracted mainly by the filter magnetic field under the low gas pressure condition. The simulation results of extracted H- ion beam intensity in the JAEA 10 ampere negative ion source without the magnetic filter tend to be smaller than the experimental results, especially under the low pressure condition. Further model improvements, e.g., modeling and implementation of the effects of the electric field near the extraction aperture, will be required to understand the extraction process of the H- ions under the low gas pressure condition.

UR - http://www.scopus.com/inward/record.url?scp=40149084031&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=40149084031&partnerID=8YFLogxK

U2 - 10.1063/1.2804898

DO - 10.1063/1.2804898

M3 - Article

C2 - 18315148

AN - SCOPUS:40149084031

VL - 79

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 2

M1 - 02A527

ER -