Numerical analysis of negative hydrogen ion beam optics by using 3D3V PIC simulation

K. Miyamoto, S. Nishioka, A. Hatayama, T. Mizuno, J. Hiratsuka, M. Kashiwagi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The negative ion beam optics is studied quantitatively from the viewpoints of the heat loads due to the beam halo in the accelerator and the emittance of the negative ion beam by using the 3D3V PIC model combined with a Monte Carlo calculation, in which negative ion beam from plasma meniscus formation to the beam acceleration is modeled. As for the heat loads of the A2G and the GRG, the simulation result almost agrees with the experimental result. The simulation result indicates that the secondary electrons from the extractor also contribute to the heat load of the A1G. Moreover, the normalized rms emittance of the negative ion beam after the exit of the GRG are estimated to be around 0.25π mm mrad, which are compatible with the typical values of the negative ion sources.

Original languageEnglish
Title of host publicationProceedings of the 17th International Conference on Ion Sources
EditorsEdgar Mahner, Richard Scrivens, Richard Pardo, Jacques Lettry, Bruce Marsh
PublisherAmerican Institute of Physics Inc.
ISBN (Print)9780735417274
DOIs
Publication statusPublished - 2018 Sep 21
Event17th International Conference on Ion Sources 2018 - Geneva, Switzerland
Duration: 2017 Sep 152017 Sep 20

Publication series

NameAIP Conference Proceedings
Volume2011
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other17th International Conference on Ion Sources 2018
CountrySwitzerland
CityGeneva
Period17/9/1517/9/20

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Miyamoto, K., Nishioka, S., Hatayama, A., Mizuno, T., Hiratsuka, J., & Kashiwagi, M. (2018). Numerical analysis of negative hydrogen ion beam optics by using 3D3V PIC simulation. In E. Mahner, R. Scrivens, R. Pardo, J. Lettry, & B. Marsh (Eds.), Proceedings of the 17th International Conference on Ion Sources [050012] (AIP Conference Proceedings; Vol. 2011). American Institute of Physics Inc.. https://doi.org/10.1063/1.5053310