Abstract
Thin carbon films have been prepared by ArF excimer laser ablation of hard fullerene-based carbon in vacuum. The target material was obtained from a pressure-temperature treatment of C60 fullerene. Micro-Raman, electron energy loss and electron diffraction measurements of deposited films reveal distinct evidence of microcrystalline diamond. Appearance of the diamond fraction in the films can be related to a peculiar structure of the target substance.
Original language | English |
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Pages (from-to) | 929-933 |
Number of pages | 5 |
Journal | Journal of Physics D: Applied Physics |
Volume | 29 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1996 Mar 14 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films