Optimal binning strategies under squared error loss in selective assembly with a tolerance constraint

Shun Matsuura, Nobuo Shinozaki

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Selective assembly is an effective approach for improving the quality of a product assembled from two types of components when the quality characteristic is the clearance between the mating components. In this article, optimal binning strategies under squared error loss in selective assembly when the clearance is constrained by a tolerance parameter are discussed. Conditions for a set of constrained optimal partition limits are given, and uniqueness of this set is shown for the case when the dimensional distributions of the two components are identical and strongly unimodal. Some numerical results are reported that compare constrained optimal partitioning, unconstrained optimal partitioning, and equal width partitioning.

Original languageEnglish
Pages (from-to)592-605
Number of pages14
JournalCommunications in Statistics - Theory and Methods
Volume39
Issue number4
DOIs
Publication statusPublished - 2010 Jan

Fingerprint

Squared Error Loss
Binning
Tolerance
Partitioning
Clearance
Optimal Partition
Uniqueness
Numerical Results
Strategy

Keywords

  • Match gauging
  • Quality control
  • Specification limits
  • Strongly unimodal

ASJC Scopus subject areas

  • Statistics and Probability

Cite this

Optimal binning strategies under squared error loss in selective assembly with a tolerance constraint. / Matsuura, Shun; Shinozaki, Nobuo.

In: Communications in Statistics - Theory and Methods, Vol. 39, No. 4, 01.2010, p. 592-605.

Research output: Contribution to journalArticle

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