TY - GEN
T1 - Optimal design of accelerated failure test under multiple stresses with an application to s-n curve estimation
AU - Yamamoto, Watalu
AU - Kagawa, Kyosuke
AU - Suzuki, Kazuyuki
PY - 2007
Y1 - 2007
N2 - There is much research on optimal reliability test plans, however most research only focuses on reliability test under single stress. This paper derives the optimal reliability test plan for drawing the S-N curves under multiple stresses. Assuming that the product lifetime distribution follows a Weibull distribution, we consider a model where the scale parameter is dependent on loaded stress and environmental stress. Based on this model, we derived the conditions required to carry out an optimal reliability test. The conditions were derived by examining the conditions that minimize the asymptotic variances of the MLE's (maximum likelihood estimators) of the unknown parameters.
AB - There is much research on optimal reliability test plans, however most research only focuses on reliability test under single stress. This paper derives the optimal reliability test plan for drawing the S-N curves under multiple stresses. Assuming that the product lifetime distribution follows a Weibull distribution, we consider a model where the scale parameter is dependent on loaded stress and environmental stress. Based on this model, we derived the conditions required to carry out an optimal reliability test. The conditions were derived by examining the conditions that minimize the asymptotic variances of the MLE's (maximum likelihood estimators) of the unknown parameters.
KW - Accelerated failure test
KW - Environmental stress
KW - Maximum likelihood method
KW - S-N curve
KW - Weibull distribution
UR - http://www.scopus.com/inward/record.url?scp=84886911215&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84886911215&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84886911215
SN - 9780976348627
T3 - Proceedings - 13th ISSAT International Conference on Reliability and Quality in Design
SP - 68
EP - 72
BT - Proceedings - 13th ISSAT International Conference on Reliability and Quality in Design
T2 - 13th ISSAT International Conference on Reliability and Quality in Design
Y2 - 2 August 2007 through 4 August 2007
ER -