### Abstract

In this report, we consider an outage probability for full-duplex single-input single-output (SISO) system. In the presence of self-interference, we derive a closed-form expression of outage probability. We consider Rayleigh and Rician fading channels for the channel between two nodes and for the self-interference channel, respectively. We evaluate the outage probability based on different K factor and signal to interference plus noise power ratio (SINR). We show that outage probability increases as the value of K increases, because the larger value of K is equivalent to the larger LOS component of self-interference power. We also show that active cancellation has better performance in terms of outage probability than passive cancellation. Moreover, we show that our closed-form expression of outage probability matches with the simulation results.

Original language | English |
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Title of host publication | Proceedings of the 20th Asia-Pacific Conference on Communication, APCC 2014 |

Publisher | Institute of Electrical and Electronics Engineers Inc. |

Pages | 6-8 |

Number of pages | 3 |

ISBN (Electronic) | 9781479964352 |

DOIs | |

Publication status | Published - 2015 Apr 22 |

Event | 20th Asia-Pacific Conference on Communication, APCC 2014 - Pattaya City, Thailand Duration: 2014 Oct 1 → 2014 Oct 3 |

### Publication series

Name | Proceedings of the 20th Asia-Pacific Conference on Communication, APCC 2014 |
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### Other

Other | 20th Asia-Pacific Conference on Communication, APCC 2014 |
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Country | Thailand |

City | Pattaya City |

Period | 14/10/1 → 14/10/3 |

### Fingerprint

### Keywords

- SISO
- full-duplex
- outage probability
- self-interference

### ASJC Scopus subject areas

- Computer Networks and Communications
- Hardware and Architecture
- Electrical and Electronic Engineering

### Cite this

*Proceedings of the 20th Asia-Pacific Conference on Communication, APCC 2014*(pp. 6-8). [7091595] (Proceedings of the 20th Asia-Pacific Conference on Communication, APCC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APCC.2014.7091595