Performance Analysis of Physical Layer Security over Rician/Nakagami-m Fading Channels

Shunya Iwata, Tomoaki Ohtsuki, P. Y. Kam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper, we investigate the secrecy performance of single-input single-output (SISO) system over fading, such that the main channel and the eavesdropper channel are subject to Rician/Nakagami-m fading or Nakagami-m/Rician fading, and derive the analytical expressions of the probability of the existence of the non-zero secrecy capacity and the outage probability of secrecy capacity. Although many authors have analyzed the secrecy performance of SISO system over various fading, the secrecy performance in the cases we assume has not been clarified. Furthermore, the simulation and numerical results show that the results using the approximation between Rician and Nakagami-m fading is insufficient in evaluating those probabilities because of only approximation to main bodies of the probability density function, and that our analyses are valid.

Original languageEnglish
Title of host publication2017 IEEE 85th Vehicular Technology Conference, VTC Spring 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2017-June
ISBN (Electronic)9781509059324
DOIs
Publication statusPublished - 2017 Nov 14
Event85th IEEE Vehicular Technology Conference, VTC Spring 2017 - Sydney, Australia
Duration: 2017 Jun 42017 Jun 7

Other

Other85th IEEE Vehicular Technology Conference, VTC Spring 2017
CountryAustralia
CitySydney
Period17/6/417/6/7

Keywords

  • Nakagami-m fading
  • Outage probability
  • Physical layer security
  • Rician fading
  • Secrecy capacity

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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  • Cite this

    Iwata, S., Ohtsuki, T., & Kam, P. Y. (2017). Performance Analysis of Physical Layer Security over Rician/Nakagami-m Fading Channels. In 2017 IEEE 85th Vehicular Technology Conference, VTC Spring 2017 - Proceedings (Vol. 2017-June). [8108517] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCSpring.2017.8108517