Performance, variability and reliability of silicon tri-gate nanowire MOSFETs

Masumi Saitoh, Kensuke Ota, Chika Tanaka, Yukio Nakabayashi, Ken Uchida, Toshinori Numata

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)

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    Engineering & Materials Science