Phase change characteristics of Ge2Sb2Te5 thin film for a self-holding optical gate switch

Tatsuya Toyosaki, Daiki Tanaka, Yuya Shoji, Masashi Kuwahara, Xiaomin Wang, Kenji Kintaka, Hitoshi Kawashima, Yuichiro Ikuma, Hiroyuki Tsuda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Fast and low power consumption optical switches are required for photonic networks. To this end, we proposed the optical gate switch using phase change material (PCM) and silicon waveguides. This switch had low power consumption because it consumed power only when the state was changed. Furthermore, the chip size is very small due to the large refractive index change of PCM. In this paper, we studied the phase-change characteristics of various kinds of thin GST film on SOI (silicon-on-insulator). A laser diode (LD) with a wavelength of 660 nm was used to irradiate the material. We compared the optical responses by laser pulse irradiation on GST films, and concluded GST-147 was the most suitable material for the optical switch because it had the lowest phase change threshold. The phase-change characteristics of GST-225 films with thickness of 25 nm, 50 nm and 75 nm were also examined. Thicker GST films had lower phase change thresholds. However, thermal simulations showed that the phase of the bottom part of thicker films may not be changed. Therefore, we concluded that GST films with thicknesses between 25 nm to 50 nm are the most suitable for optical switches.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7943
DOIs
Publication statusPublished - 2011
EventSilicon Photonics VI - San Francisco, CA, United States
Duration: 2011 Jan 232011 Jan 26

Other

OtherSilicon Photonics VI
CountryUnited States
CitySan Francisco, CA
Period11/1/2311/1/26

Fingerprint

Optical switches
Phase Change
Thin Films
Switch
Optical Switch
switches
Phase change materials
Switches
Silicon
Thick films
Thin films
Phase Change Material
Electric power utilization
thin films
phase change materials
Power Consumption
thick films
Photonics
Semiconductor lasers
Laser pulses

Keywords

  • Optical switch
  • Phase-change material
  • Pulse irradiation
  • Silicon photonics
  • Silicon-on-insulator
  • Thermal simulation
  • Thin film

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Toyosaki, T., Tanaka, D., Shoji, Y., Kuwahara, M., Wang, X., Kintaka, K., ... Tsuda, H. (2011). Phase change characteristics of Ge2Sb2Te5 thin film for a self-holding optical gate switch. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7943). [794306] https://doi.org/10.1117/12.874712

Phase change characteristics of Ge2Sb2Te5 thin film for a self-holding optical gate switch. / Toyosaki, Tatsuya; Tanaka, Daiki; Shoji, Yuya; Kuwahara, Masashi; Wang, Xiaomin; Kintaka, Kenji; Kawashima, Hitoshi; Ikuma, Yuichiro; Tsuda, Hiroyuki.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7943 2011. 794306.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Toyosaki, T, Tanaka, D, Shoji, Y, Kuwahara, M, Wang, X, Kintaka, K, Kawashima, H, Ikuma, Y & Tsuda, H 2011, Phase change characteristics of Ge2Sb2Te5 thin film for a self-holding optical gate switch. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7943, 794306, Silicon Photonics VI, San Francisco, CA, United States, 11/1/23. https://doi.org/10.1117/12.874712
Toyosaki T, Tanaka D, Shoji Y, Kuwahara M, Wang X, Kintaka K et al. Phase change characteristics of Ge2Sb2Te5 thin film for a self-holding optical gate switch. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7943. 2011. 794306 https://doi.org/10.1117/12.874712
Toyosaki, Tatsuya ; Tanaka, Daiki ; Shoji, Yuya ; Kuwahara, Masashi ; Wang, Xiaomin ; Kintaka, Kenji ; Kawashima, Hitoshi ; Ikuma, Yuichiro ; Tsuda, Hiroyuki. / Phase change characteristics of Ge2Sb2Te5 thin film for a self-holding optical gate switch. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7943 2011.
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