Photoelectrical properties of undoped and Na-doped Cu2ZnSnS4 single crystals measured by optical time-resolved spectroscopy

Le Quang Phuong, Makoto Okano, Yasuhiro Yamada, Akira Nagaoka, Kenji Yoshino, Yoshihiko Kanemitsu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have studied photocarrier recombination and relaxation dynamics in Cu2ZnSnS4 (CZTS) single crystals using a combination of various optical time-resolved spectroscopy. The band tails and deep defects govern primarily the photocarrier dynamics in CZTS. We pointed out the physical origins behind low power conversion efficiencies of CZTS-based solar cells. In addition, we found that the photocarrier lifetime increases as Na is doped in CZTS; this result implies that Na doping suppresses a part of nonradiative recombination centers in CZTS. Therefore, Na dopant is important to improve the photovoltaic performance of CZTS-based solar cells.

Original languageEnglish
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479979448
DOIs
Publication statusPublished - 2015 Dec 14
Externally publishedYes
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: 2015 Jun 142015 Jun 19

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period15/6/1415/6/19

Keywords

  • Cu2ZnSnS4
  • photocarrier dynamics
  • sodium doping
  • solar cells
  • time-resolved spectroscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    Phuong, L. Q., Okano, M., Yamada, Y., Nagaoka, A., Yoshino, K., & Kanemitsu, Y. (2015). Photoelectrical properties of undoped and Na-doped Cu2ZnSnS4 single crystals measured by optical time-resolved spectroscopy. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 [7356088] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7356088