Photoelectron spectroscopy of silicon-carbon cluster anions

Atsushi Nakajima, T. Taguwa, K. Nakao, M. Gomei, R. Kishi, S. Iwata, K. Kaya

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Photoelectron spectra of CnSim- cluster anions (3≤ n, m ≤6) were measured at the photon energy of 3.49 eV, by using a magnetic-bottle electron spectrometer having ∼60-meV resolution. The CnSim- clusters were produced by laser vaporization of a carbon-silicon mixture rod in a He carrier gas. The spectra of the C1Sim-1- clusters are similar to those of pure Si-m clusters in the peak positions and their envelopes, which is attributed to the similarity in electronic structure of Si and C atoms, leading to a similar geometry. In contrast, the similarity in the photoelectron spectra is not observed between C-n and Cn-1Si1- clusters, which is attributed to a change in their geometry; from chain to ring.

Original languageEnglish
Pages (from-to)411-415
Number of pages5
JournalSurface Review and Letters
Volume3
Issue number1
Publication statusPublished - 1996 Feb

Fingerprint

Carbon clusters
Silicon
Photoelectron spectroscopy
Photoelectrons
Anions
Negative ions
photoelectron spectroscopy
anions
Geometry
carbon
Bottles
silicon
Vaporization
Electronic structure
Spectrometers
Carbon
Photons
Gases
photoelectrons
Atoms

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

Nakajima, A., Taguwa, T., Nakao, K., Gomei, M., Kishi, R., Iwata, S., & Kaya, K. (1996). Photoelectron spectroscopy of silicon-carbon cluster anions. Surface Review and Letters, 3(1), 411-415.

Photoelectron spectroscopy of silicon-carbon cluster anions. / Nakajima, Atsushi; Taguwa, T.; Nakao, K.; Gomei, M.; Kishi, R.; Iwata, S.; Kaya, K.

In: Surface Review and Letters, Vol. 3, No. 1, 02.1996, p. 411-415.

Research output: Contribution to journalArticle

Nakajima, A, Taguwa, T, Nakao, K, Gomei, M, Kishi, R, Iwata, S & Kaya, K 1996, 'Photoelectron spectroscopy of silicon-carbon cluster anions', Surface Review and Letters, vol. 3, no. 1, pp. 411-415.
Nakajima A, Taguwa T, Nakao K, Gomei M, Kishi R, Iwata S et al. Photoelectron spectroscopy of silicon-carbon cluster anions. Surface Review and Letters. 1996 Feb;3(1):411-415.
Nakajima, Atsushi ; Taguwa, T. ; Nakao, K. ; Gomei, M. ; Kishi, R. ; Iwata, S. ; Kaya, K. / Photoelectron spectroscopy of silicon-carbon cluster anions. In: Surface Review and Letters. 1996 ; Vol. 3, No. 1. pp. 411-415.
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