Photoelectron spectroscopy of silicon-carbon cluster anions

A. Nakajima, T. Taguwa, K. Nakao, M. Gomei, R. Kishi, S. Iwata, K. Kaya

Research output: Contribution to journalArticle

3 Citations (Scopus)


Photoelectron spectra of CnSim- cluster anions (3≤ n, m ≤6) were measured at the photon energy of 3.49 eV, by using a magnetic-bottle electron spectrometer having ∼60-meV resolution. The CnSim- clusters were produced by laser vaporization of a carbon-silicon mixture rod in a He carrier gas. The spectra of the C1Sim-1- clusters are similar to those of pure Si-m clusters in the peak positions and their envelopes, which is attributed to the similarity in electronic structure of Si and C atoms, leading to a similar geometry. In contrast, the similarity in the photoelectron spectra is not observed between C-n and Cn-1Si1- clusters, which is attributed to a change in their geometry; from chain to ring.

Original languageEnglish
Pages (from-to)411-415
Number of pages5
JournalSurface Review and Letters
Issue number1
Publication statusPublished - 1996 Feb

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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    Nakajima, A., Taguwa, T., Nakao, K., Gomei, M., Kishi, R., Iwata, S., & Kaya, K. (1996). Photoelectron spectroscopy of silicon-carbon cluster anions. Surface Review and Letters, 3(1), 411-415.