Photoelectron spectroscopy of silicon-fluorine binary cluster anions (SinFm -)

Hiroshi Kawamata, Yuichi Negishi, Reiko Kishi, Suehiro Iwata, Atsushi Nakajima, Koji Kaya

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Abstract

Electronic properties of silicon-fluorine cluster anions (SinFm -; n=1-11, HZ = 1-3) were investigated by photoelectron spectroscopy using a magnetic-bottle type electron spectrometer. The binary cluster anions were generated by a laser vaporization of a silicon rod in an He carrier gas mixed with a small amount of SiF4 or F2 gas. The highly abundant clusters are SiFm - (m=3 and 5) and SinF- (n=6, 7, and 10) in their mass spectra. In the photoelectron spectra of SiFm - (m = 1-5), the clusters having odd m have higher electron affinity (EA) than those having even in, indicating that the even/odd alternation in EA is attributed to their electronic structures of a closed/open valence shell. Comparison between photoelectron spectra of SinF- and Sin - (n=4-11) gives the insight that the doped F atom can remove one electron from the corresponding Sin - cluster without any serious rearrangement of Sin - framework, because only the first peak of Sin -, corresponding singly occupied molecular orbital (SOMO), disappears and other successive spectral features are unchanged with the F atom doping. In some clusters, furthermore, the vibrational structures could be resolved to determine a vibrational frequency and to presume the geometry with ab initio molecular orbital calculations.

Original languageEnglish
Pages (from-to)5369-5376
Number of pages8
JournalJournal of Chemical Physics
Volume105
Issue number13
DOIs
Publication statusPublished - 1996 Jan 1

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ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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