Abstract
The effects of changing the lattice isotopes on defects produced by silicon implantation were analyzed using photoluminescence (PL) technique. It was observed that X and W zero-phonon lines (ZPLs) shift between natSi and 30Si was +1.55(5) and +1.27(5) meV. ZPL shifts were caused by the effects of the electron-phonon coupling to the continuum of lattice modes. X centers had low vibrational modes (LVMs) of quanta 66.2, and 69.0 meV in natSi, and W center has LVMs of 70.0 meV. It was shown that the assignments of the X and W centers to the self-interstitial clusters supported the existence of above modes.
Original language | English |
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Pages (from-to) | 1754-1756 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 96 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2004 Aug 1 |
ASJC Scopus subject areas
- Physics and Astronomy(all)