Physical random number generator based on MOS structure after soft breakdown

Shinichi Yasuda; Hideki Satake; Tetsufumi Tanamoto; Ryuji Ohba; Ken Uchida; Shinobu Fujita

doi:10.1109/JSSC.2004.831480

Physical random number generator based on MOS structure after soft breakdown

Shinichi Yasuda, Hideki Satake, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Shinobu Fujita

Research output: Contribution to journal › Article

17 Citations (Scopus)

Abstract

We present a novel physical random number generator (RNG) that uses a metal-oxide semiconductor (MOS) capacitor after soft breakdown (SBD) as a random source. It is known that the electrical properties of MOS capacitors after SBD show large fluctuation. When the resistor in an astable multivibrator is replaced with an MOS capacitor after SBD, the multivibrator converts the noise signal into a rectangular wave whose period fluctuates randomly. A 1-bit counter and a flip-flop are used to generate random numbers from the fluctuating rectangular wave. Some high-level tests indicate that the generated random numbers have excellent quality for cryptographic applications. Even though our circuit is small and can be constructed using about 20 complementary-MOS logic gates and several passive devices, high-quality random numbers such as those generated by large physical RNGs can be obtained.

Original language	English
Pages (from-to)	1375-1377
Number of pages	3
Journal	IEEE Journal of Solid-State Circuits
Volume	39
Issue number	8
DOIs	https://doi.org/10.1109/JSSC.2004.831480
Publication status	Published - 2004 Aug 1

Keywords

Astable multivibrator
Noise
Random number generator
Soft breakdown

ASJC Scopus subject areas

Electrical and Electronic Engineering

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Yasuda, S., Satake, H., Tanamoto, T., Ohba, R., Uchida, K., & Fujita, S. (2004). Physical random number generator based on MOS structure after soft breakdown. IEEE Journal of Solid-State Circuits, 39(8), 1375-1377. https://doi.org/10.1109/JSSC.2004.831480

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AU - Yasuda, Shinichi

AU - Satake, Hideki

AU - Tanamoto, Tetsufumi

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AU - Uchida, Ken

AU - Fujita, Shinobu

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N2 - We present a novel physical random number generator (RNG) that uses a metal-oxide semiconductor (MOS) capacitor after soft breakdown (SBD) as a random source. It is known that the electrical properties of MOS capacitors after SBD show large fluctuation. When the resistor in an astable multivibrator is replaced with an MOS capacitor after SBD, the multivibrator converts the noise signal into a rectangular wave whose period fluctuates randomly. A 1-bit counter and a flip-flop are used to generate random numbers from the fluctuating rectangular wave. Some high-level tests indicate that the generated random numbers have excellent quality for cryptographic applications. Even though our circuit is small and can be constructed using about 20 complementary-MOS logic gates and several passive devices, high-quality random numbers such as those generated by large physical RNGs can be obtained.

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