Pipe wall thickness inspection with current driven thermal method

Satoshi Honda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Electric potential difference(EPD) method is widely used for diagnosing and monitoring flow conduits. Theoretical analysis and the exact solution of the electrical potential field in pipe wall have been proposed, and 2D approximation is effective for small pipe wall thickness. This study proposes to use temperature distribution driven by Joule heat with the electric current other than electrical potential difference. Under thin wall approximation, 2D electric and thermal problems are analysed and exact solutions are given.

Original languageEnglish
Title of host publicationProceedings of the SICE Annual Conference
Pages1060-1064
Number of pages5
Publication statusPublished - 2010
EventSICE Annual Conference 2010, SICE 2010 - Taipei, Taiwan, Province of China
Duration: 2010 Aug 182010 Aug 21

Other

OtherSICE Annual Conference 2010, SICE 2010
CountryTaiwan, Province of China
CityTaipei
Period10/8/1810/8/21

Fingerprint

Inspection
Pipe
Confined flow
Heat problems
Electric currents
Temperature distribution
Monitoring
Electric potential
Hot Temperature

Keywords

  • Electric potential difference
  • Forward analysis
  • Nondestructive test
  • Pipe wall thinning
  • Thermal image

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Computer Science Applications

Cite this

Honda, S. (2010). Pipe wall thickness inspection with current driven thermal method. In Proceedings of the SICE Annual Conference (pp. 1060-1064). [5602937]

Pipe wall thickness inspection with current driven thermal method. / Honda, Satoshi.

Proceedings of the SICE Annual Conference. 2010. p. 1060-1064 5602937.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Honda, S 2010, Pipe wall thickness inspection with current driven thermal method. in Proceedings of the SICE Annual Conference., 5602937, pp. 1060-1064, SICE Annual Conference 2010, SICE 2010, Taipei, Taiwan, Province of China, 10/8/18.
Honda S. Pipe wall thickness inspection with current driven thermal method. In Proceedings of the SICE Annual Conference. 2010. p. 1060-1064. 5602937
Honda, Satoshi. / Pipe wall thickness inspection with current driven thermal method. Proceedings of the SICE Annual Conference. 2010. pp. 1060-1064
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