Polarization-dependent four-wave mixing measurements in highly-stacked InAs quantum dots

M. Kujiraoka, J. Ishi-Hayase, K. Akahane, N. Yamamoto, K. Ema, M. Sasaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We measure the polarization dependence of four-wave mixing (FWM) signals in highly-stacked InAs quantum dots on an InP(311)B substrate. Dephasing time T2 and FWM signal intensity show large anisotropy for the crystal axes. The measured T2 is determined only by the exciton population lifetime, and thus the polarization dependence of T2 reflects the difference of the transition dipole moments related to bright exciton states with orthogonally linear polarizations.

Original languageEnglish
Title of host publicationPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
Pages975-976
Number of pages2
DOIs
Publication statusPublished - 2007 Dec 1
Externally publishedYes
Event28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
Duration: 2006 Jul 242006 Jul 28

Publication series

NameAIP Conference Proceedings
Volume893
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other28th International Conference on the Physics of Semiconductors, ICPS 2006
CountryAustria
CityVienna
Period06/7/2406/7/28

Keywords

  • Coherent spectroscopy
  • Dephasing
  • Optical anisotropy
  • Quantum dots

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Kujiraoka, M., Ishi-Hayase, J., Akahane, K., Yamamoto, N., Ema, K., & Sasaki, M. (2007). Polarization-dependent four-wave mixing measurements in highly-stacked InAs quantum dots. In Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B (pp. 975-976). (AIP Conference Proceedings; Vol. 893). https://doi.org/10.1063/1.2730220