Position and velocity measurement method from a single image using modulated illumination

Kentaro Matsuo, Takahiro Yakoh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Visual feedback systems utilize position and velocity information estimated from frames captured by a camera. Since the velocity information is derrived through pseudo differential with two consecutive frames, the information must be delayed essentially, and the delay often limits the performance of visual feedback systems. To eliminate the delay, this paper proposed a novel technique to estimate position and velocity information from a single image. By detecting the start and end points of the motion blur of a target object in an image, the velocity information during the exposure time of the image can be estimated fundamentally. To tag such a temporal information on motion blurs, a modulated illumination was employed. This tagging method aimed to make motion blur detection robust against various background scenery. Some simulation results validated the feasibility of the proposed method.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE 15th International Workshop on Advanced Motion Control, AMC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages353-358
Number of pages6
ISBN (Electronic)9781538619469
DOIs
Publication statusPublished - 2018 Jun 1
Event15th IEEE International Workshop on Advanced Motion Control, AMC 2018 - Tokyo, Japan
Duration: 2018 Mar 92018 Mar 11

Other

Other15th IEEE International Workshop on Advanced Motion Control, AMC 2018
CountryJapan
CityTokyo
Period18/3/918/3/11

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ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Mechanical Engineering
  • Control and Optimization

Cite this

Matsuo, K., & Yakoh, T. (2018). Position and velocity measurement method from a single image using modulated illumination. In Proceedings - 2018 IEEE 15th International Workshop on Advanced Motion Control, AMC 2018 (pp. 353-358). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AMC.2019.8371117