Preface to Special Topic: Defects in Semiconductors

Tetsuya Yamamoto, Yasufumi Fujiwara, Kohei M Itoh

Research output: Contribution to journal › Editorial

@article{ebaee60566d84fffabe3b4f999c0c0ca,

title = "Preface to Special Topic: Defects in Semiconductors",

author = "Tetsuya Yamamoto and Yasufumi Fujiwara and Itoh, {Kohei M}",

year = "2018",

month = apr

day = "28",

doi = "10.1063/1.5036660",

language = "English",

volume = "123",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "16",

}

TY - JOUR

T1 - Preface to Special Topic

T2 - Defects in Semiconductors

AU - Yamamoto, Tetsuya

AU - Fujiwara, Yasufumi

AU - Itoh, Kohei M

PY - 2018/4/28

Y1 - 2018/4/28

UR - http://www.scopus.com/inward/record.url?scp=85046400312&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85046400312&partnerID=8YFLogxK

U2 - 10.1063/1.5036660

DO - 10.1063/1.5036660

M3 - Editorial

AN - SCOPUS:85046400312

VL - 123

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 16

M1 - 161301

ER -