Original language | English |
---|---|
Article number | 161301 |
Journal | Journal of Applied Physics |
Volume | 123 |
Issue number | 16 |
DOIs | |
Publication status | Published - 2018 Apr 28 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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Preface to Special Topic : Defects in Semiconductors. / Yamamoto, Tetsuya; Fujiwara, Yasufumi; Itoh, Kohei M.
In: Journal of Applied Physics, Vol. 123, No. 16, 161301, 28.04.2018.Research output: Contribution to journal › Editorial
}
TY - JOUR
T1 - Preface to Special Topic
T2 - Defects in Semiconductors
AU - Yamamoto, Tetsuya
AU - Fujiwara, Yasufumi
AU - Itoh, Kohei M
PY - 2018/4/28
Y1 - 2018/4/28
UR - http://www.scopus.com/inward/record.url?scp=85046400312&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85046400312&partnerID=8YFLogxK
U2 - 10.1063/1.5036660
DO - 10.1063/1.5036660
M3 - Editorial
AN - SCOPUS:85046400312
VL - 123
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 16
M1 - 161301
ER -