Preface to Special Topic: Defects in Semiconductors

Tetsuya Yamamoto; Yasufumi Fujiwara; Kohei M. Itoh

doi:10.1063/1.5036660

Preface to Special Topic: Defects in Semiconductors

Tetsuya Yamamoto, Yasufumi Fujiwara, Kohei M. Itoh

Department of Applied Physics and Physico-Informatics

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	161301
Journal	Journal of Applied Physics
Volume	123
Issue number	16
DOIs	https://doi.org/10.1063/1.5036660
Publication status	Published - 2018 Apr 28

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.5036660

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title = "Preface to Special Topic: Defects in Semiconductors",

author = "Tetsuya Yamamoto and Yasufumi Fujiwara and Itoh, {Kohei M.}",

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language = "English",

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journal = "Journal of Applied Physics",

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AU - Itoh, Kohei M.

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JF - Journal of Applied Physics

SN - 0021-8979

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Preface to Special Topic: Defects in Semiconductors

ASJC Scopus subject areas

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