| Original language | English |
|---|---|
| Article number | 161301 |
| Journal | Journal of Applied Physics |
| Volume | 123 |
| Issue number | 16 |
| DOIs | |
| Publication status | Published - 2018 Apr 28 |
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defects
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Yamamoto, T., Fujiwara, Y., & Itoh, K. M. (2018). Preface to Special Topic: Defects in Semiconductors. Journal of Applied Physics, 123(16), [161301]. https://doi.org/10.1063/1.5036660
Preface to Special Topic : Defects in Semiconductors. / Yamamoto, Tetsuya; Fujiwara, Yasufumi; Itoh, Kohei M.
In: Journal of Applied Physics, Vol. 123, No. 16, 161301, 28.04.2018.Research output: Contribution to journal › Editorial
Yamamoto, T, Fujiwara, Y & Itoh, KM 2018, 'Preface to Special Topic: Defects in Semiconductors', Journal of Applied Physics, vol. 123, no. 16, 161301. https://doi.org/10.1063/1.5036660
Yamamoto T, Fujiwara Y, Itoh KM. Preface to Special Topic: Defects in Semiconductors. Journal of Applied Physics. 2018 Apr 28;123(16). 161301. https://doi.org/10.1063/1.5036660
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