Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

Masahiro Shibuta; Toyoaki Eguchi; Yoshio Watanabe; Jin Young Son; Hiroshi Oji; Atsushi Nakajima

doi:10.1063/1.4768940

Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

Masahiro Shibuta, Toyoaki Eguchi, Yoshio Watanabe, Jin Young Son, Hiroshi Oji, Atsushi Nakajima

Department of Chemistry

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C₆₀ film, while there is no such additional feature for copper phthalocyanine deposited onto a C₆₀ film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C ₆₀ intermixed layer with a thickness of 5.1 nm is formed at the interface.

Original language	English
Article number	221603
Journal	Applied Physics Letters
Volume	101
Issue number	22
DOIs	https://doi.org/10.1063/1.4768940
Publication status	Published - 2012 Nov 26

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.4768940

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@article{650ca7f6e38b4d91ae67ba10f99506cc,

title = "Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy",

abstract = "We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.",

author = "Masahiro Shibuta and Toyoaki Eguchi and Yoshio Watanabe and Son, {Jin Young} and Hiroshi Oji and Atsushi Nakajima",

note = "Funding Information: This work is partly supported by MEXT-Supported Program for the Strategic Research Foundation at Private Universities, 2009-2013.",

year = "2012",

month = nov,

day = "26",

doi = "10.1063/1.4768940",

language = "English",

volume = "101",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "22",

}

TY - JOUR

T1 - Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

AU - Shibuta, Masahiro

AU - Eguchi, Toyoaki

AU - Watanabe, Yoshio

AU - Son, Jin Young

AU - Oji, Hiroshi

AU - Nakajima, Atsushi

N1 - Funding Information: This work is partly supported by MEXT-Supported Program for the Strategic Research Foundation at Private Universities, 2009-2013.

PY - 2012/11/26

Y1 - 2012/11/26

N2 - We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

AB - We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

UR - http://www.scopus.com/inward/record.url?scp=84870562319&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84870562319&partnerID=8YFLogxK

U2 - 10.1063/1.4768940

DO - 10.1063/1.4768940

M3 - Article

AN - SCOPUS:84870562319

SN - 0003-6951

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 22

M1 - 221603

ER -

Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

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