Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

Masahiro Shibuta, Toyoaki Eguchi, Yoshio Watanabe, Jin Young Son, Hiroshi Oji, Atsushi Nakajima

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

Original languageEnglish
Article number221603
JournalApplied Physics Letters
Volume101
Issue number22
DOIs
Publication statusPublished - 2012 Nov 26

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x ray spectroscopy
photoelectron spectroscopy
metals
copper
probes
electronics
molecules
interactions

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy. / Shibuta, Masahiro; Eguchi, Toyoaki; Watanabe, Yoshio; Son, Jin Young; Oji, Hiroshi; Nakajima, Atsushi.

In: Applied Physics Letters, Vol. 101, No. 22, 221603, 26.11.2012.

Research output: Contribution to journalArticle

Shibuta, Masahiro ; Eguchi, Toyoaki ; Watanabe, Yoshio ; Son, Jin Young ; Oji, Hiroshi ; Nakajima, Atsushi. / Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy. In: Applied Physics Letters. 2012 ; Vol. 101, No. 22.
@article{650ca7f6e38b4d91ae67ba10f99506cc,
title = "Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy",
abstract = "We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.",
author = "Masahiro Shibuta and Toyoaki Eguchi and Yoshio Watanabe and Son, {Jin Young} and Hiroshi Oji and Atsushi Nakajima",
year = "2012",
month = "11",
day = "26",
doi = "10.1063/1.4768940",
language = "English",
volume = "101",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "22",

}

TY - JOUR

T1 - Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

AU - Shibuta, Masahiro

AU - Eguchi, Toyoaki

AU - Watanabe, Yoshio

AU - Son, Jin Young

AU - Oji, Hiroshi

AU - Nakajima, Atsushi

PY - 2012/11/26

Y1 - 2012/11/26

N2 - We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

AB - We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

UR - http://www.scopus.com/inward/record.url?scp=84870562319&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84870562319&partnerID=8YFLogxK

U2 - 10.1063/1.4768940

DO - 10.1063/1.4768940

M3 - Article

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 22

M1 - 221603

ER -