Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

In X-ray diffraction imaging (XDI) experiments using X-ray free electron laser (XEFL), X-ray pulses provided at a repetition rate of more than 30 Hz enable us the collection of a large number of diffraction patterns within a short period of time. Diffraction patterns with good signal-to-noise ratios are stochastically obtained depending on the positional coincidence of the XFEL pulses and particles dispersed onto membranes. Because of the large number of diffraction patterns exceeding 31,000 per hour, automatic processing is necessary to efficiently extract those patterns worth analyzing, for instance, through selection regarding signal-to-noise ratio and merging patterns simultaneously recorded by two detectors. Here, a software suite for XFEL-XDI experiments is introduced. The algorithms and the procedures will be helpful for developing data processing software for automatically treating a large amount of two-dimensional data.

Original languageEnglish
Title of host publicationSpringer Series in Optical Sciences
PublisherSpringer Verlag
Pages125-140
Number of pages16
DOIs
Publication statusPublished - 2018 Jan 1

Publication series

NameSpringer Series in Optical Sciences
Volume210
ISSN (Print)0342-4111
ISSN (Electronic)1556-1534

Fingerprint

X ray lasers
Free electron lasers
Diffraction patterns
Laser pulses
Imaging techniques
X ray diffraction
Processing
Experiments
Merging
Signal to noise ratio
Detectors
Membranes
X rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Nakasako, M. (2018). Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses. In Springer Series in Optical Sciences (pp. 125-140). (Springer Series in Optical Sciences; Vol. 210). Springer Verlag. https://doi.org/10.1007/978-4-431-56618-2_6

Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses. / Nakasako, Masayoshi.

Springer Series in Optical Sciences. Springer Verlag, 2018. p. 125-140 (Springer Series in Optical Sciences; Vol. 210).

Research output: Chapter in Book/Report/Conference proceedingChapter

Nakasako, M 2018, Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses. in Springer Series in Optical Sciences. Springer Series in Optical Sciences, vol. 210, Springer Verlag, pp. 125-140. https://doi.org/10.1007/978-4-431-56618-2_6
Nakasako, Masayoshi. / Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses. Springer Series in Optical Sciences. Springer Verlag, 2018. pp. 125-140 (Springer Series in Optical Sciences).
@inbook{44c2842ee63f4b189bfd4356db31dd21,
title = "Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses",
abstract = "In X-ray diffraction imaging (XDI) experiments using X-ray free electron laser (XEFL), X-ray pulses provided at a repetition rate of more than 30 Hz enable us the collection of a large number of diffraction patterns within a short period of time. Diffraction patterns with good signal-to-noise ratios are stochastically obtained depending on the positional coincidence of the XFEL pulses and particles dispersed onto membranes. Because of the large number of diffraction patterns exceeding 31,000 per hour, automatic processing is necessary to efficiently extract those patterns worth analyzing, for instance, through selection regarding signal-to-noise ratio and merging patterns simultaneously recorded by two detectors. Here, a software suite for XFEL-XDI experiments is introduced. The algorithms and the procedures will be helpful for developing data processing software for automatically treating a large amount of two-dimensional data.",
author = "Masayoshi Nakasako",
year = "2018",
month = "1",
day = "1",
doi = "10.1007/978-4-431-56618-2_6",
language = "English",
series = "Springer Series in Optical Sciences",
publisher = "Springer Verlag",
pages = "125--140",
booktitle = "Springer Series in Optical Sciences",
address = "Germany",

}

TY - CHAP

T1 - Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses

AU - Nakasako, Masayoshi

PY - 2018/1/1

Y1 - 2018/1/1

N2 - In X-ray diffraction imaging (XDI) experiments using X-ray free electron laser (XEFL), X-ray pulses provided at a repetition rate of more than 30 Hz enable us the collection of a large number of diffraction patterns within a short period of time. Diffraction patterns with good signal-to-noise ratios are stochastically obtained depending on the positional coincidence of the XFEL pulses and particles dispersed onto membranes. Because of the large number of diffraction patterns exceeding 31,000 per hour, automatic processing is necessary to efficiently extract those patterns worth analyzing, for instance, through selection regarding signal-to-noise ratio and merging patterns simultaneously recorded by two detectors. Here, a software suite for XFEL-XDI experiments is introduced. The algorithms and the procedures will be helpful for developing data processing software for automatically treating a large amount of two-dimensional data.

AB - In X-ray diffraction imaging (XDI) experiments using X-ray free electron laser (XEFL), X-ray pulses provided at a repetition rate of more than 30 Hz enable us the collection of a large number of diffraction patterns within a short period of time. Diffraction patterns with good signal-to-noise ratios are stochastically obtained depending on the positional coincidence of the XFEL pulses and particles dispersed onto membranes. Because of the large number of diffraction patterns exceeding 31,000 per hour, automatic processing is necessary to efficiently extract those patterns worth analyzing, for instance, through selection regarding signal-to-noise ratio and merging patterns simultaneously recorded by two detectors. Here, a software suite for XFEL-XDI experiments is introduced. The algorithms and the procedures will be helpful for developing data processing software for automatically treating a large amount of two-dimensional data.

UR - http://www.scopus.com/inward/record.url?scp=85044827163&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85044827163&partnerID=8YFLogxK

U2 - 10.1007/978-4-431-56618-2_6

DO - 10.1007/978-4-431-56618-2_6

M3 - Chapter

AN - SCOPUS:85044827163

T3 - Springer Series in Optical Sciences

SP - 125

EP - 140

BT - Springer Series in Optical Sciences

PB - Springer Verlag

ER -