Profilometry based on two-photon absorption in a silicon avalanche photodiode

Yosuke Tanaka, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, Mitsuo Takeda

    Research output: Contribution to journalArticlepeer-review

    24 Citations (Scopus)

    Abstract

    A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach - Zehnder interferometer.

    Original languageEnglish
    Pages (from-to)402-404
    Number of pages3
    JournalOptics Letters
    Volume28
    Issue number6
    DOIs
    Publication statusPublished - 2003 Mar 15

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

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