Profilometry based on two-photon absorption in a silicon avalanche photodiode

Yosuke Tanaka, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, Mitsuo Takeda

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach - Zehnder interferometer.

Original languageEnglish
Pages (from-to)402-404
Number of pages3
JournalOptics Letters
Volume28
Issue number6
DOIs
Publication statusPublished - 2003 Mar 15

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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