Quantitative description of the micro structure and its relationship to the critical current density of Ag-sheathed Bi(2223)

Tomonari Tsuchiya, Tetsuhiko Isobe, Mamoru Senna, Mitsuru Itoh, Tsutomu Koizumi

Research output: Contribution to journalArticle

Abstract

By refining the etching technique and subsequent graphic processing, the contiguity, relative alignment and thickness of grains in Ag-sheathed Bi(2223) tape were evaluated from a cross-sectional electron micrograph. Graphic processing was achieved by digitization, inversion and skeletonization of each grain, followed by a description of the two-dimensional distribution of the three-forked crossings ('switches') and the grain thickness. A simple quasi-linear relation between the switch density and the critical current density, Jc, was observed, indicating the significance of the grain contiguity.

Original languageEnglish
Pages (from-to)321-326
Number of pages6
JournalSolid State Ionics
Volume108
Issue number1-4
DOIs
Publication statusPublished - 1998 May 1

Keywords

  • Bi(2223)
  • Critical current density
  • High-T superconductor
  • Image analysis
  • Microstructure

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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