Quantitative evaluation of patterned self-assembled monolayers by color imaging of zeta-potential obtained from two-color fluorescence and evanescent wave illumination

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1 Citation (Scopus)

Abstract

A direct evaluation technique by color imaging of the zeta-potential for a substrate surface with material heterogeneity, sample adhesion and patterns of chemical coating and self-assembled monolayers (SAMs) was developed. This technique employed two-color fluorescence excited by the evanescent wave for the zeta-potential measurement. The experiments were conducted to evaluate the monolayers of octadecyltrichrolosilane patterned on the glass surface. The color mapping of wall zetapotential of SAMs patterned on the microchannel wall was achieved, which has not been realized by the conventional techniques focusing on thickness and structure of molecules and wettability.

Original languageEnglish
Pages643-645
Number of pages3
Publication statusPublished - 2008
Event12th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2008 - San Diego, CA, United States
Duration: 2008 Oct 122008 Oct 16

Other

Other12th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2008
CountryUnited States
CitySan Diego, CA
Period08/10/1208/10/16

Keywords

  • Evanescent wave
  • Fluorescence
  • SAMs
  • Zeta-potential

ASJC Scopus subject areas

  • Chemical Engineering (miscellaneous)
  • Bioengineering

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    Kazoe, Y., Miyakawa, S., Miki, N., & Sato, Y. (2008). Quantitative evaluation of patterned self-assembled monolayers by color imaging of zeta-potential obtained from two-color fluorescence and evanescent wave illumination. 643-645. Paper presented at 12th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2008, San Diego, CA, United States.