Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex:C

Ken Morita, Kohei M. Itoh, Lone Hoffmann, Brian B. Nielsen, Hiroshi Harima, Kohji Mizoguchi

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGex:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.

Original languageEnglish
Pages (from-to)5905-5906
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number10
DOIs
Publication statusPublished - 2001 Oct

Keywords

  • Infrared absorption
  • Localized vibrational mode of carbon
  • Raman-spectroscopy
  • SiGe:C

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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