Randomly Optimized Grid Graph for Low-Latency Interconnection Networks

Koji Nakano, Daisuke Takafuji, Satoshi Fujita, Hiroki Matsutani, Ikki Fujiwara, Michihiro Koibuchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

In this work we present randomly optimized grid graphs that maximize the performance measure, such as diameter and average shortest path length (ASPL), with subject to limited edge length on a grid surface. We also provide theoretical lower bounds of the diameter and the ASPL, which prove optimality of our randomly optimized grid graphs. We further present a diagonal grid layout that significantly reduces the diameter compared to the conventional one under the edge-length limitation. We finally show their applications to three case studies of off-and on-chip interconnection networks. Our design efficiently improves their performance measures, such as end-to-end communication latency, network power consumption, cost, and execution time of parallel benchmarks.

Original languageEnglish
Title of host publicationProceedings - 45th International Conference on Parallel Processing, ICPP 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages340-349
Number of pages10
Volume2016-September
ISBN (Electronic)9781509028238
DOIs
Publication statusPublished - 2016 Sep 21
Event45th International Conference on Parallel Processing, ICPP 2016 - Philadelphia, United States
Duration: 2016 Aug 162016 Aug 19

Other

Other45th International Conference on Parallel Processing, ICPP 2016
CountryUnited States
CityPhiladelphia
Period16/8/1616/8/19

Keywords

  • Graph Theory
  • Network

ASJC Scopus subject areas

  • Software
  • Mathematics(all)
  • Hardware and Architecture

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  • Cite this

    Nakano, K., Takafuji, D., Fujita, S., Matsutani, H., Fujiwara, I., & Koibuchi, M. (2016). Randomly Optimized Grid Graph for Low-Latency Interconnection Networks. In Proceedings - 45th International Conference on Parallel Processing, ICPP 2016 (Vol. 2016-September, pp. 340-349). [7573835] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICPP.2016.46