Recent advances in near-field optical microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Summary form only given. Current progress in the instrumentation and measurements of NSOM is described. The most critical element in NSOM is an aperture probe, which is a tapered and metal-coated optical fiber. The design and fabrication of the probe are examined with regard to aperture quality and the efficiency of light propagation. The recent dramatic improvements in spatial resolution and optical throughput are illustrated by selected applications, Raman spectroscopy, polarization microscopy, and the emission imaging of semiconductor nanostructures and single molecules. Real-space mapping of exciton wavefunctions confined in a quantum dot is also demonstrated as an application of NSOM to wavefunction engineering.

Original languageEnglish
Title of host publication2002 International Microprocesses and Nanotechnology Conference, MNC 2002
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6-7
Number of pages2
ISBN (Print)4891140313, 9784891140311
DOIs
Publication statusPublished - 2002
EventInternational Microprocesses and Nanotechnology Conference, MNC 2002 - Tokyo, Japan
Duration: 2002 Nov 62002 Nov 8

Other

OtherInternational Microprocesses and Nanotechnology Conference, MNC 2002
CountryJapan
CityTokyo
Period02/11/602/11/8

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ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Saiki, T. (2002). Recent advances in near-field optical microscopy. In 2002 International Microprocesses and Nanotechnology Conference, MNC 2002 (pp. 6-7). [1178516] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMNC.2002.1178516