Recovery of shape and surface reflectance of specular object from rotation of light source

Hideo Saito, Kazuko Omata, Shinji Ozawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a method for recovery of shape and surface reflectance of specular object from color images taken with the light source rotating. The image sequence is taken with a fixed camera while the light source is relatively rotating around the axis parallel to the optical axis of the camera. We derive the relationship between the body reflectance at every object surface point and the rotating angle of the object. For the adapting specular reflectance case, we develop the algorithm to extract only the body reflectance component which obeys the derived relationship for estimating surface normals and the body reflectance component. As a result, the object shape and body reflectance distribution of the object surface can be recovered. In addition to this, reflectance parameters of specularity are also estimated by minimizing the fitting error of the specular reflectance model. For demonstrating the effectiveness of the proposed method, we show the shape, body reflectance, and specular reflectance of specular objects, which are successfully recovered by the proposed method.

Original languageEnglish
Title of host publicationProceedings - 2nd International Conference on 3-D Digital Imaging and Modeling, 3DIM 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages526-535
Number of pages10
ISBN (Print)0769500625, 9780769500621
DOIs
Publication statusPublished - 1999 Jan 1
Event2nd International Conference on 3-D Digital Imaging and Modeling, 3DIM 1999 - Ottawa, United States
Duration: 1999 Oct 41999 Oct 8

Publication series

NameProceedings - 2nd International Conference on 3-D Digital Imaging and Modeling, 3DIM 1999

Other

Other2nd International Conference on 3-D Digital Imaging and Modeling, 3DIM 1999
Country/TerritoryUnited States
CityOttawa
Period99/10/499/10/8

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Modelling and Simulation
  • Instrumentation

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