Recovery of X-ray radiation damage in anthracene single crystals

Kohei Yokoi, Yujiro Ohba

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Imperfections are introduced in anthracene single crystals by low energy (≤ 20 keV) X-ray irradiation. About 60% of these imperfections can be recovered by annealing. The activation energy for recovery of the structural defects is measured to be 1.12 eV, using triplet excitons as a probe.

Original languageEnglish
Pages (from-to)560-562
Number of pages3
JournalChemical Physics Letters
Volume56
Issue number3
DOIs
Publication statusPublished - 1978 Jun 15

Fingerprint

Radiation damage
anthracene
radiation damage
recovery
Single crystals
Recovery
X rays
Defects
single crystals
defects
x rays
Activation energy
excitons
Irradiation
Annealing
activation energy
irradiation
annealing
probes
energy

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

Recovery of X-ray radiation damage in anthracene single crystals. / Yokoi, Kohei; Ohba, Yujiro.

In: Chemical Physics Letters, Vol. 56, No. 3, 15.06.1978, p. 560-562.

Research output: Contribution to journalArticle

Yokoi, Kohei ; Ohba, Yujiro. / Recovery of X-ray radiation damage in anthracene single crystals. In: Chemical Physics Letters. 1978 ; Vol. 56, No. 3. pp. 560-562.
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