Abstract
Imperfections are introduced in anthracene single crystals by low energy (≤ 20 keV) X-ray irradiation. About 60% of these imperfections can be recovered by annealing. The activation energy for recovery of the structural defects is measured to be 1.12 eV, using triplet excitons as a probe.
Original language | English |
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Pages (from-to) | 560-562 |
Number of pages | 3 |
Journal | Chemical Physics Letters |
Volume | 56 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1978 Jun 15 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry