Recovery of X-ray radiation damage in anthracene single crystals

Kohei Yokoi, Yujiro Ohba

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Imperfections are introduced in anthracene single crystals by low energy (≤ 20 keV) X-ray irradiation. About 60% of these imperfections can be recovered by annealing. The activation energy for recovery of the structural defects is measured to be 1.12 eV, using triplet excitons as a probe.

Original languageEnglish
Pages (from-to)560-562
Number of pages3
JournalChemical Physics Letters
Volume56
Issue number3
DOIs
Publication statusPublished - 1978 Jun 15

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ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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