Reflectometry based on two-photon absorption of a silicon avalanche photodiode

Y. Tanaka, P. G. Chua, T. Kurokawa, H. Tsuda, M. Naganuma, M. Takeda

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)

    Abstract

    Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.

    Original languageEnglish
    Title of host publication2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages577-580
    Number of pages4
    ISBN (Electronic)0780372891, 9780780372894
    DOIs
    Publication statusPublished - 2002 Jan 1
    Event15th Optical Fiber Sensors Conference Technical Digest, OFS 2002 - Portland, United States
    Duration: 2002 May 62002 May 10

    Publication series

    Name2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002

    Other

    Other15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
    CountryUnited States
    CityPortland
    Period02/5/602/5/10

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Electrical and Electronic Engineering

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  • Cite this

    Tanaka, Y., Chua, P. G., Kurokawa, T., Tsuda, H., Naganuma, M., & Takeda, M. (2002). Reflectometry based on two-photon absorption of a silicon avalanche photodiode. In 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002 (pp. 577-580). [1000807] (2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OFS.2002.1000807