Reflectometry based on two-photon absorption of a silicon avalanche photodiode

Y. Tanaka; P. G. Chua; T. Kurokawa; H. Tsuda; M. Naganuma; M. Takeda

doi:10.1109/OFS.2002.1000807

Reflectometry based on two-photon absorption of a silicon avalanche photodiode

Y. Tanaka, P. G. Chua, T. Kurokawa, H. Tsuda, M. Naganuma, M. Takeda

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.

Original language	English
Title of host publication	2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	577-580
Number of pages	4
ISBN (Electronic)	0780372891, 9780780372894
DOIs	https://doi.org/10.1109/OFS.2002.1000807
Publication status	Published - 2002 Jan 1
Event	15th Optical Fiber Sensors Conference Technical Digest, OFS 2002 - Portland, United States Duration: 2002 May 6 → 2002 May 10

Publication series

Name	2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002

Other

Other	15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
Country/Territory	United States
City	Portland
Period	02/5/6 → 02/5/10

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/OFS.2002.1000807

Cite this

Tanaka, Y., Chua, P. G., Kurokawa, T., Tsuda, H., Naganuma, M., & Takeda, M. (2002). Reflectometry based on two-photon absorption of a silicon avalanche photodiode. In 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002 (pp. 577-580). [1000807] (2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OFS.2002.1000807

Reflectometry based on two-photon absorption of a silicon avalanche photodiode. / Tanaka, Y.; Chua, P. G.; Kurokawa, T. et al.

2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 577-580 1000807 (2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tanaka, Y, Chua, PG, Kurokawa, T, Tsuda, H, Naganuma, M & Takeda, M 2002, Reflectometry based on two-photon absorption of a silicon avalanche photodiode. in 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002., 1000807, 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002, Institute of Electrical and Electronics Engineers Inc., pp. 577-580, 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002, Portland, United States, 02/5/6. https://doi.org/10.1109/OFS.2002.1000807

Tanaka Y, Chua PG, Kurokawa T, Tsuda H, Naganuma M, Takeda M. Reflectometry based on two-photon absorption of a silicon avalanche photodiode. In 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 577-580. 1000807. (2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002). doi: 10.1109/OFS.2002.1000807

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Reflectometry based on two-photon absorption of a silicon avalanche photodiode

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