Reinforcement Learning System Comprising Resistive Analog Neuromorphic Devices

Song Ju Kim, Kaori Ohkoda, Masashi Aono, Hisashi Shima, Makoto Takahashi, Yasuhisa Naitoh, Hiroyuki Akinaga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Reinforcement learning algorithms are widely used in many practical artificial-intelligence (AI) applications. Herein, we propose a compact hardware-based learning system comprising analogue resistive memory devices called 'resistive analogue neuromorphic devices (RAND).' We begin by showing that the resistance of a RAND linearly varies with the voltage pulses, meaning that a single RAND is sufficient to solve a reinforcement learning problem (i.e. the '2-armed bandit problem') using 'tug-of-war (TOW) dynamics.' Next, we show that 2k-armed bandit problems are also solved by hierarchically combining 2k-1 RANDs. Finally, we numerically demonstrate that the proposed methods are promising as compared with conventional methods.

Original languageEnglish
Title of host publication2019 IEEE International Reliability Physics Symposium, IRPS 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538695043
DOIs
Publication statusPublished - 2019 May 22
Event2019 IEEE International Reliability Physics Symposium, IRPS 2019 - Monterey, United States
Duration: 2019 Mar 312019 Apr 4

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
Volume2019-March
ISSN (Print)1541-7026

Conference

Conference2019 IEEE International Reliability Physics Symposium, IRPS 2019
CountryUnited States
CityMonterey
Period19/3/3119/4/4

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Keywords

  • Decision making
  • Natural computing
  • RAND
  • Reinforcement learning
  • TOW dynamics

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Kim, S. J., Ohkoda, K., Aono, M., Shima, H., Takahashi, M., Naitoh, Y., & Akinaga, H. (2019). Reinforcement Learning System Comprising Resistive Analog Neuromorphic Devices. In 2019 IEEE International Reliability Physics Symposium, IRPS 2019 [8720428] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2019-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS.2019.8720428