Resonant escape over an oscillating barrier in a single-electron ratchet transfer

Satoru Miyamoto, Katsuhiko Nishiguchi, Yukinori Ono, Kohei M Itoh, Akira Fujiwara

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time-scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.

Original languageEnglish
Article number033303
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume82
Issue number3
DOIs
Publication statusPublished - 2010 Jul 22

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escape
electron transfer
Electrons
Silicon
electrons
Synchronization
Chemical activation
Modulation
metastable state
synchronism
signatures
activation
modulation
oscillations
silicon

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Resonant escape over an oscillating barrier in a single-electron ratchet transfer. / Miyamoto, Satoru; Nishiguchi, Katsuhiko; Ono, Yukinori; Itoh, Kohei M; Fujiwara, Akira.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 82, No. 3, 033303, 22.07.2010.

Research output: Contribution to journalArticle

Miyamoto, Satoru ; Nishiguchi, Katsuhiko ; Ono, Yukinori ; Itoh, Kohei M ; Fujiwara, Akira. / Resonant escape over an oscillating barrier in a single-electron ratchet transfer. In: Physical Review B - Condensed Matter and Materials Physics. 2010 ; Vol. 82, No. 3.
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