TY - JOUR
T1 - Resonant escape over an oscillating barrier in a single-electron ratchet transfer
AU - Miyamoto, Satoru
AU - Nishiguchi, Katsuhiko
AU - Ono, Yukinori
AU - Itoh, Kohei M.
AU - Fujiwara, Akira
PY - 2010/7/22
Y1 - 2010/7/22
N2 - Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time-scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.
AB - Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time-scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.
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U2 - 10.1103/PhysRevB.82.033303
DO - 10.1103/PhysRevB.82.033303
M3 - Article
AN - SCOPUS:77956707977
SN - 1098-0121
VL - 82
JO - Physical Review B-Condensed Matter
JF - Physical Review B-Condensed Matter
IS - 3
M1 - 033303
ER -