Risk factors for early replacement of cardiovascular implantable electronic devices

Yoshiyasu Aizawa, Akira Kunitomi, Kazuaki Nakajima, Shin Kashimura, Yoshinori Katsumata, Takahiko Nishiyama, Takehiro Kimura, Nobuhiro Nishiyama, Yoko Tanimoto, Shun Kohsaka, Seiji Takatsuki, Keiichi Fukuda

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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