Robust force control of a pantograph system by considering model parameter perturbation

Toru Namerikawa, Shin ya Goto, Fumio Matsumura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The active controlled-type pantograph was studied to regulate a pressure between a pantograph and overhead wiring and to control a contact force against various disturbances. Some results on pantograph control was reported, where LQ, observer, and H control were employed. Parametric uncertainty and uncertainty caused by unmodeled dynamics were considered, and their quantities were measured.

Original languageEnglish
Title of host publicationIEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM
PublisherIEEE
Pages45
Number of pages1
Publication statusPublished - 1997
Externally publishedYes
EventProceedings of the 1997 1st IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM'97 - Tokyo, Jpn
Duration: 1997 Jun 161997 Jun 20

Other

OtherProceedings of the 1997 1st IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM'97
CityTokyo, Jpn
Period97/6/1697/6/20

Fingerprint

Pantographs
Force control
Robust control
Electric wiring
Uncertainty

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Namerikawa, T., Goto, S. Y., & Matsumura, F. (1997). Robust force control of a pantograph system by considering model parameter perturbation. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM (pp. 45). IEEE.

Robust force control of a pantograph system by considering model parameter perturbation. / Namerikawa, Toru; Goto, Shin ya; Matsumura, Fumio.

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM. IEEE, 1997. p. 45.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Namerikawa, T, Goto, SY & Matsumura, F 1997, Robust force control of a pantograph system by considering model parameter perturbation. in IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM. IEEE, pp. 45, Proceedings of the 1997 1st IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM'97, Tokyo, Jpn, 97/6/16.
Namerikawa T, Goto SY, Matsumura F. Robust force control of a pantograph system by considering model parameter perturbation. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM. IEEE. 1997. p. 45
Namerikawa, Toru ; Goto, Shin ya ; Matsumura, Fumio. / Robust force control of a pantograph system by considering model parameter perturbation. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM. IEEE, 1997. pp. 45
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