Robustness of scalable all-optical logic gates

Akihiro Fushimi, Takasumi Tanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We designed scalable all-optical logic gates that operate at the same input and output wavelength based on microrings. We investigated the influence of input power fluctuations and fabrication errors.

Original languageEnglish
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of American (OSA)
ISBN (Print)9781557529992
Publication statusPublished - 2014
EventCLEO: Science and Innovations, CLEO_SI 2014 - San Jose, CA, United States
Duration: 2014 Jun 82014 Jun 13

Other

OtherCLEO: Science and Innovations, CLEO_SI 2014
CountryUnited States
CitySan Jose, CA
Period14/6/814/6/13

Fingerprint

Logic gates
logic
Fabrication
Wavelength
fabrication
output
wavelengths

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Fushimi, A., & Tanabe, T. (2014). Robustness of scalable all-optical logic gates. In Optics InfoBase Conference Papers Optical Society of American (OSA).

Robustness of scalable all-optical logic gates. / Fushimi, Akihiro; Tanabe, Takasumi.

Optics InfoBase Conference Papers. Optical Society of American (OSA), 2014.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fushimi, A & Tanabe, T 2014, Robustness of scalable all-optical logic gates. in Optics InfoBase Conference Papers. Optical Society of American (OSA), CLEO: Science and Innovations, CLEO_SI 2014, San Jose, CA, United States, 14/6/8.
Fushimi A, Tanabe T. Robustness of scalable all-optical logic gates. In Optics InfoBase Conference Papers. Optical Society of American (OSA). 2014
Fushimi, Akihiro ; Tanabe, Takasumi. / Robustness of scalable all-optical logic gates. Optics InfoBase Conference Papers. Optical Society of American (OSA), 2014.
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