Robustness of scalable all-optical logic gates

Akihiro Fushimi, Takasumi Tanabe

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    We designed scalable all-optical logic gates that operate at the same input and output wavelength based on microrings. We investigated the influence of input power fluctuations and fabrication errors.

    Original languageEnglish
    Title of host publicationConference on Lasers and Electro-Optics Europe - Technical Digest
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Volume2014-January
    Publication statusPublished - 2014
    Event2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States
    Duration: 2014 Jun 82014 Jun 13

    Other

    Other2014 Conference on Lasers and Electro-Optics, CLEO 2014
    CountryUnited States
    CitySan Jose
    Period14/6/814/6/13

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Atomic and Molecular Physics, and Optics
    • Electronic, Optical and Magnetic Materials

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  • Cite this

    Fushimi, A., & Tanabe, T. (2014). Robustness of scalable all-optical logic gates. In Conference on Lasers and Electro-Optics Europe - Technical Digest (Vol. 2014-January). [6989157] Institute of Electrical and Electronics Engineers Inc..