Robustness of scalable all-optical logic gates

Akihiro Fushimi, Takasumi Tanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We designed scalable all-optical logic gates that operate at the same input and output wavelength based on microrings. We investigated the influence of input power fluctuations and fabrication errors.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics Europe - Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2014-January
Publication statusPublished - 2014
Event2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States
Duration: 2014 Jun 82014 Jun 13

Other

Other2014 Conference on Lasers and Electro-Optics, CLEO 2014
CountryUnited States
CitySan Jose
Period14/6/814/6/13

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

Cite this

Fushimi, A., & Tanabe, T. (2014). Robustness of scalable all-optical logic gates. In Conference on Lasers and Electro-Optics Europe - Technical Digest (Vol. 2014-January). [6989157] Institute of Electrical and Electronics Engineers Inc..